A four-point surface conductivity probe suitable for in situ ultrahigh vacuum conductivity measurements

A simple design for a four-point probe suitable for precision surface conductivity measurements is described. Our design makes use of small, commercially available spring contact probes which are mounted in a custom built MACOR ceramic probe head. The design is suitable for use in ultrahigh vacuum a...

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Bibliographic Details
Published in:Review of scientific instruments 1997-04, Vol.68 (4), p.1812-1813
Main Authors: Wiegenstein, Christopher G., Schulz, Kirk H.
Format: Article
Language:English
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Summary:A simple design for a four-point probe suitable for precision surface conductivity measurements is described. Our design makes use of small, commercially available spring contact probes which are mounted in a custom built MACOR ceramic probe head. The design is suitable for use in ultrahigh vacuum applications, and the custom-built parts can be fabricated in any machine shop. Very reproducible values were obtained using this probe for surface conductivity measurements on a MoS 2 (0001) model catalyst, a sputter deposited indium-tin oxide thin film and a doped silicon wafer.
ISSN:0034-6748
1089-7623
DOI:10.1063/1.1147968