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Optical beam deflection noncontact atomic force microscope optimized with three-dimensional beam adjustment mechanism
We present a design and performance of an optical beam deflection noncontact atomic force microscope (nc–AFM). The optical deflection detection system can be optimized by the three-dimensional beam position adjustment mechanism (the slider which mounts laser diode module, the spherical rotors with m...
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Published in: | Review of scientific instruments 2000-01, Vol.71 (1), p.128-132 |
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Language: | English |
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cites | cdi_FETCH-LOGICAL-c297t-c4af9173b26ffa79d5c2dc7de5b1ac167ac9b743ce2960deebf943f23ddb273 |
container_end_page | 132 |
container_issue | 1 |
container_start_page | 128 |
container_title | Review of scientific instruments |
container_volume | 71 |
creator | Yokoyama, Kousuke Ochi, Taketoshi Uchihashi, Takayuki Ashino, Makoto Sugawara, Yasuhiro Suehira, Nobuhito Morita, Seizo |
description | We present a design and performance of an optical beam deflection noncontact atomic force microscope (nc–AFM). The optical deflection detection system can be optimized by the three-dimensional beam position adjustment mechanism (the slider which mounts laser diode module, the spherical rotors with mirror and the cylinder which mounts quadrant photodiode) using inertial stepping motors in an ultrahigh vacuum (UHV). The samples and cantilevers are easily exchanged in UHV. The performance of the instrument is demonstrated with the atomically resolved nc-AFM images for various surfaces such as
Si(111)7×7
,
Cu(111)
,
TiO
2
(110)
,
and thymine/highly oriented pyrolytic graphite. |
doi_str_mv | 10.1063/1.1150174 |
format | article |
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Si(111)7×7
,
Cu(111)
,
TiO
2
(110)
,
and thymine/highly oriented pyrolytic graphite.</description><identifier>ISSN: 0034-6748</identifier><identifier>EISSN: 1089-7623</identifier><identifier>DOI: 10.1063/1.1150174</identifier><identifier>CODEN: RSINAK</identifier><language>eng</language><ispartof>Review of scientific instruments, 2000-01, Vol.71 (1), p.128-132</ispartof><rights>American Institute of Physics</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c297t-c4af9173b26ffa79d5c2dc7de5b1ac167ac9b743ce2960deebf943f23ddb273</citedby><cites>FETCH-LOGICAL-c297t-c4af9173b26ffa79d5c2dc7de5b1ac167ac9b743ce2960deebf943f23ddb273</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://pubs.aip.org/rsi/article-lookup/doi/10.1063/1.1150174$$EHTML$$P50$$Gscitation$$H</linktohtml><link.rule.ids>314,780,782,784,795,27923,27924,76254</link.rule.ids></links><search><creatorcontrib>Yokoyama, Kousuke</creatorcontrib><creatorcontrib>Ochi, Taketoshi</creatorcontrib><creatorcontrib>Uchihashi, Takayuki</creatorcontrib><creatorcontrib>Ashino, Makoto</creatorcontrib><creatorcontrib>Sugawara, Yasuhiro</creatorcontrib><creatorcontrib>Suehira, Nobuhito</creatorcontrib><creatorcontrib>Morita, Seizo</creatorcontrib><title>Optical beam deflection noncontact atomic force microscope optimized with three-dimensional beam adjustment mechanism</title><title>Review of scientific instruments</title><description>We present a design and performance of an optical beam deflection noncontact atomic force microscope (nc–AFM). The optical deflection detection system can be optimized by the three-dimensional beam position adjustment mechanism (the slider which mounts laser diode module, the spherical rotors with mirror and the cylinder which mounts quadrant photodiode) using inertial stepping motors in an ultrahigh vacuum (UHV). The samples and cantilevers are easily exchanged in UHV. The performance of the instrument is demonstrated with the atomically resolved nc-AFM images for various surfaces such as
Si(111)7×7
,
Cu(111)
,
TiO
2
(110)
,
and thymine/highly oriented pyrolytic graphite.</description><issn>0034-6748</issn><issn>1089-7623</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2000</creationdate><recordtype>article</recordtype><recordid>eNqdkMFKAzEQhoMoWKsH3yBXha3JZnfTHKVoFQo96H3JTiY0pdksSaro07ulFe_OZYbhm4_hJ-SWsxlnjXjgM85rxmV1RiaczVUhm1KckwljoioaWc0vyVVKWzZWzfmE7NdDdqB3tEPtqUG7Q8gu9LQPPYQ-a8hU5-AdUBsiIB2nGBKEAWkYT737RkM_Xd7QvImIhXEe-zQafp3abPcpj8tMPcJG9y75a3Jh9S7hzalPydvz0_vipVitl6-Lx1UBpZK5gEpbxaXoysZaLZWpoTQgDdYd18AbqUF1shKApWqYQeysqoQthTFdKcWU3B2th49TRNsO0Xkdv1rO2kNaLW9PaY3s_ZFN4LI-JPA_-CPEP7AdjBU_HDJ84A</recordid><startdate>200001</startdate><enddate>200001</enddate><creator>Yokoyama, Kousuke</creator><creator>Ochi, Taketoshi</creator><creator>Uchihashi, Takayuki</creator><creator>Ashino, Makoto</creator><creator>Sugawara, Yasuhiro</creator><creator>Suehira, Nobuhito</creator><creator>Morita, Seizo</creator><scope>AAYXX</scope><scope>CITATION</scope></search><sort><creationdate>200001</creationdate><title>Optical beam deflection noncontact atomic force microscope optimized with three-dimensional beam adjustment mechanism</title><author>Yokoyama, Kousuke ; Ochi, Taketoshi ; Uchihashi, Takayuki ; Ashino, Makoto ; Sugawara, Yasuhiro ; Suehira, Nobuhito ; Morita, Seizo</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c297t-c4af9173b26ffa79d5c2dc7de5b1ac167ac9b743ce2960deebf943f23ddb273</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2000</creationdate><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Yokoyama, Kousuke</creatorcontrib><creatorcontrib>Ochi, Taketoshi</creatorcontrib><creatorcontrib>Uchihashi, Takayuki</creatorcontrib><creatorcontrib>Ashino, Makoto</creatorcontrib><creatorcontrib>Sugawara, Yasuhiro</creatorcontrib><creatorcontrib>Suehira, Nobuhito</creatorcontrib><creatorcontrib>Morita, Seizo</creatorcontrib><collection>CrossRef</collection><jtitle>Review of scientific instruments</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Yokoyama, Kousuke</au><au>Ochi, Taketoshi</au><au>Uchihashi, Takayuki</au><au>Ashino, Makoto</au><au>Sugawara, Yasuhiro</au><au>Suehira, Nobuhito</au><au>Morita, Seizo</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Optical beam deflection noncontact atomic force microscope optimized with three-dimensional beam adjustment mechanism</atitle><jtitle>Review of scientific instruments</jtitle><date>2000-01</date><risdate>2000</risdate><volume>71</volume><issue>1</issue><spage>128</spage><epage>132</epage><pages>128-132</pages><issn>0034-6748</issn><eissn>1089-7623</eissn><coden>RSINAK</coden><abstract>We present a design and performance of an optical beam deflection noncontact atomic force microscope (nc–AFM). The optical deflection detection system can be optimized by the three-dimensional beam position adjustment mechanism (the slider which mounts laser diode module, the spherical rotors with mirror and the cylinder which mounts quadrant photodiode) using inertial stepping motors in an ultrahigh vacuum (UHV). The samples and cantilevers are easily exchanged in UHV. The performance of the instrument is demonstrated with the atomically resolved nc-AFM images for various surfaces such as
Si(111)7×7
,
Cu(111)
,
TiO
2
(110)
,
and thymine/highly oriented pyrolytic graphite.</abstract><doi>10.1063/1.1150174</doi><tpages>5</tpages></addata></record> |
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language | eng |
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source | American Institute of Physics (AIP) Publications; American Institute of Physics:Jisc Collections:Transitional Journals Agreement 2021-23 (Reading list) |
title | Optical beam deflection noncontact atomic force microscope optimized with three-dimensional beam adjustment mechanism |
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