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Optical beam deflection noncontact atomic force microscope optimized with three-dimensional beam adjustment mechanism

We present a design and performance of an optical beam deflection noncontact atomic force microscope (nc–AFM). The optical deflection detection system can be optimized by the three-dimensional beam position adjustment mechanism (the slider which mounts laser diode module, the spherical rotors with m...

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Published in:Review of scientific instruments 2000-01, Vol.71 (1), p.128-132
Main Authors: Yokoyama, Kousuke, Ochi, Taketoshi, Uchihashi, Takayuki, Ashino, Makoto, Sugawara, Yasuhiro, Suehira, Nobuhito, Morita, Seizo
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Language:English
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cited_by cdi_FETCH-LOGICAL-c297t-c4af9173b26ffa79d5c2dc7de5b1ac167ac9b743ce2960deebf943f23ddb273
cites cdi_FETCH-LOGICAL-c297t-c4af9173b26ffa79d5c2dc7de5b1ac167ac9b743ce2960deebf943f23ddb273
container_end_page 132
container_issue 1
container_start_page 128
container_title Review of scientific instruments
container_volume 71
creator Yokoyama, Kousuke
Ochi, Taketoshi
Uchihashi, Takayuki
Ashino, Makoto
Sugawara, Yasuhiro
Suehira, Nobuhito
Morita, Seizo
description We present a design and performance of an optical beam deflection noncontact atomic force microscope (nc–AFM). The optical deflection detection system can be optimized by the three-dimensional beam position adjustment mechanism (the slider which mounts laser diode module, the spherical rotors with mirror and the cylinder which mounts quadrant photodiode) using inertial stepping motors in an ultrahigh vacuum (UHV). The samples and cantilevers are easily exchanged in UHV. The performance of the instrument is demonstrated with the atomically resolved nc-AFM images for various surfaces such as Si(111)7×7 , Cu(111) , TiO 2 (110) , and thymine/highly oriented pyrolytic graphite.
doi_str_mv 10.1063/1.1150174
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fullrecord <record><control><sourceid>scitation_cross</sourceid><recordid>TN_cdi_scitation_primary_10_1063_1_1150174</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>rsi</sourcerecordid><originalsourceid>FETCH-LOGICAL-c297t-c4af9173b26ffa79d5c2dc7de5b1ac167ac9b743ce2960deebf943f23ddb273</originalsourceid><addsrcrecordid>eNqdkMFKAzEQhoMoWKsH3yBXha3JZnfTHKVoFQo96H3JTiY0pdksSaro07ulFe_OZYbhm4_hJ-SWsxlnjXjgM85rxmV1RiaczVUhm1KckwljoioaWc0vyVVKWzZWzfmE7NdDdqB3tEPtqUG7Q8gu9LQPPYQ-a8hU5-AdUBsiIB2nGBKEAWkYT737RkM_Xd7QvImIhXEe-zQafp3abPcpj8tMPcJG9y75a3Jh9S7hzalPydvz0_vipVitl6-Lx1UBpZK5gEpbxaXoysZaLZWpoTQgDdYd18AbqUF1shKApWqYQeysqoQthTFdKcWU3B2th49TRNsO0Xkdv1rO2kNaLW9PaY3s_ZFN4LI-JPA_-CPEP7AdjBU_HDJ84A</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype></control><display><type>article</type><title>Optical beam deflection noncontact atomic force microscope optimized with three-dimensional beam adjustment mechanism</title><source>American Institute of Physics (AIP) Publications</source><source>American Institute of Physics:Jisc Collections:Transitional Journals Agreement 2021-23 (Reading list)</source><creator>Yokoyama, Kousuke ; Ochi, Taketoshi ; Uchihashi, Takayuki ; Ashino, Makoto ; Sugawara, Yasuhiro ; Suehira, Nobuhito ; Morita, Seizo</creator><creatorcontrib>Yokoyama, Kousuke ; Ochi, Taketoshi ; Uchihashi, Takayuki ; Ashino, Makoto ; Sugawara, Yasuhiro ; Suehira, Nobuhito ; Morita, Seizo</creatorcontrib><description>We present a design and performance of an optical beam deflection noncontact atomic force microscope (nc–AFM). The optical deflection detection system can be optimized by the three-dimensional beam position adjustment mechanism (the slider which mounts laser diode module, the spherical rotors with mirror and the cylinder which mounts quadrant photodiode) using inertial stepping motors in an ultrahigh vacuum (UHV). The samples and cantilevers are easily exchanged in UHV. The performance of the instrument is demonstrated with the atomically resolved nc-AFM images for various surfaces such as Si(111)7×7 , Cu(111) , TiO 2 (110) , and thymine/highly oriented pyrolytic graphite.</description><identifier>ISSN: 0034-6748</identifier><identifier>EISSN: 1089-7623</identifier><identifier>DOI: 10.1063/1.1150174</identifier><identifier>CODEN: RSINAK</identifier><language>eng</language><ispartof>Review of scientific instruments, 2000-01, Vol.71 (1), p.128-132</ispartof><rights>American Institute of Physics</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c297t-c4af9173b26ffa79d5c2dc7de5b1ac167ac9b743ce2960deebf943f23ddb273</citedby><cites>FETCH-LOGICAL-c297t-c4af9173b26ffa79d5c2dc7de5b1ac167ac9b743ce2960deebf943f23ddb273</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://pubs.aip.org/rsi/article-lookup/doi/10.1063/1.1150174$$EHTML$$P50$$Gscitation$$H</linktohtml><link.rule.ids>314,780,782,784,795,27923,27924,76254</link.rule.ids></links><search><creatorcontrib>Yokoyama, Kousuke</creatorcontrib><creatorcontrib>Ochi, Taketoshi</creatorcontrib><creatorcontrib>Uchihashi, Takayuki</creatorcontrib><creatorcontrib>Ashino, Makoto</creatorcontrib><creatorcontrib>Sugawara, Yasuhiro</creatorcontrib><creatorcontrib>Suehira, Nobuhito</creatorcontrib><creatorcontrib>Morita, Seizo</creatorcontrib><title>Optical beam deflection noncontact atomic force microscope optimized with three-dimensional beam adjustment mechanism</title><title>Review of scientific instruments</title><description>We present a design and performance of an optical beam deflection noncontact atomic force microscope (nc–AFM). The optical deflection detection system can be optimized by the three-dimensional beam position adjustment mechanism (the slider which mounts laser diode module, the spherical rotors with mirror and the cylinder which mounts quadrant photodiode) using inertial stepping motors in an ultrahigh vacuum (UHV). The samples and cantilevers are easily exchanged in UHV. The performance of the instrument is demonstrated with the atomically resolved nc-AFM images for various surfaces such as Si(111)7×7 , Cu(111) , TiO 2 (110) , and thymine/highly oriented pyrolytic graphite.</description><issn>0034-6748</issn><issn>1089-7623</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2000</creationdate><recordtype>article</recordtype><recordid>eNqdkMFKAzEQhoMoWKsH3yBXha3JZnfTHKVoFQo96H3JTiY0pdksSaro07ulFe_OZYbhm4_hJ-SWsxlnjXjgM85rxmV1RiaczVUhm1KckwljoioaWc0vyVVKWzZWzfmE7NdDdqB3tEPtqUG7Q8gu9LQPPYQ-a8hU5-AdUBsiIB2nGBKEAWkYT737RkM_Xd7QvImIhXEe-zQafp3abPcpj8tMPcJG9y75a3Jh9S7hzalPydvz0_vipVitl6-Lx1UBpZK5gEpbxaXoysZaLZWpoTQgDdYd18AbqUF1shKApWqYQeysqoQthTFdKcWU3B2th49TRNsO0Xkdv1rO2kNaLW9PaY3s_ZFN4LI-JPA_-CPEP7AdjBU_HDJ84A</recordid><startdate>200001</startdate><enddate>200001</enddate><creator>Yokoyama, Kousuke</creator><creator>Ochi, Taketoshi</creator><creator>Uchihashi, Takayuki</creator><creator>Ashino, Makoto</creator><creator>Sugawara, Yasuhiro</creator><creator>Suehira, Nobuhito</creator><creator>Morita, Seizo</creator><scope>AAYXX</scope><scope>CITATION</scope></search><sort><creationdate>200001</creationdate><title>Optical beam deflection noncontact atomic force microscope optimized with three-dimensional beam adjustment mechanism</title><author>Yokoyama, Kousuke ; Ochi, Taketoshi ; Uchihashi, Takayuki ; Ashino, Makoto ; Sugawara, Yasuhiro ; Suehira, Nobuhito ; Morita, Seizo</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c297t-c4af9173b26ffa79d5c2dc7de5b1ac167ac9b743ce2960deebf943f23ddb273</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2000</creationdate><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Yokoyama, Kousuke</creatorcontrib><creatorcontrib>Ochi, Taketoshi</creatorcontrib><creatorcontrib>Uchihashi, Takayuki</creatorcontrib><creatorcontrib>Ashino, Makoto</creatorcontrib><creatorcontrib>Sugawara, Yasuhiro</creatorcontrib><creatorcontrib>Suehira, Nobuhito</creatorcontrib><creatorcontrib>Morita, Seizo</creatorcontrib><collection>CrossRef</collection><jtitle>Review of scientific instruments</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Yokoyama, Kousuke</au><au>Ochi, Taketoshi</au><au>Uchihashi, Takayuki</au><au>Ashino, Makoto</au><au>Sugawara, Yasuhiro</au><au>Suehira, Nobuhito</au><au>Morita, Seizo</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Optical beam deflection noncontact atomic force microscope optimized with three-dimensional beam adjustment mechanism</atitle><jtitle>Review of scientific instruments</jtitle><date>2000-01</date><risdate>2000</risdate><volume>71</volume><issue>1</issue><spage>128</spage><epage>132</epage><pages>128-132</pages><issn>0034-6748</issn><eissn>1089-7623</eissn><coden>RSINAK</coden><abstract>We present a design and performance of an optical beam deflection noncontact atomic force microscope (nc–AFM). The optical deflection detection system can be optimized by the three-dimensional beam position adjustment mechanism (the slider which mounts laser diode module, the spherical rotors with mirror and the cylinder which mounts quadrant photodiode) using inertial stepping motors in an ultrahigh vacuum (UHV). The samples and cantilevers are easily exchanged in UHV. The performance of the instrument is demonstrated with the atomically resolved nc-AFM images for various surfaces such as Si(111)7×7 , Cu(111) , TiO 2 (110) , and thymine/highly oriented pyrolytic graphite.</abstract><doi>10.1063/1.1150174</doi><tpages>5</tpages></addata></record>
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title Optical beam deflection noncontact atomic force microscope optimized with three-dimensional beam adjustment mechanism
url http://sfxeu10.hosted.exlibrisgroup.com/loughborough?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-08T17%3A45%3A18IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-scitation_cross&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Optical%20beam%20deflection%20noncontact%20atomic%20force%20microscope%20optimized%20with%20three-dimensional%20beam%20adjustment%20mechanism&rft.jtitle=Review%20of%20scientific%20instruments&rft.au=Yokoyama,%20Kousuke&rft.date=2000-01&rft.volume=71&rft.issue=1&rft.spage=128&rft.epage=132&rft.pages=128-132&rft.issn=0034-6748&rft.eissn=1089-7623&rft.coden=RSINAK&rft_id=info:doi/10.1063/1.1150174&rft_dat=%3Cscitation_cross%3Ersi%3C/scitation_cross%3E%3Cgrp_id%3Ecdi_FETCH-LOGICAL-c297t-c4af9173b26ffa79d5c2dc7de5b1ac167ac9b743ce2960deebf943f23ddb273%3C/grp_id%3E%3Coa%3E%3C/oa%3E%3Curl%3E%3C/url%3E&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true