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Development of laser assisted nanometric resolution scanning tunneling microscopy time-of-flight mass analyzer system

This study describes a ground-breaking process that provides a direct highly localized measurement of the atomic mass on surfaces at room temperature. Employing an original system that joins a scanning tunneling microscopy (STM) device and a time-of-flight (TOF) mass analyzer, we could locally ioniz...

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Bibliographic Details
Published in:Review of scientific instruments 2002-09, Vol.73 (9), p.3227-3231
Main Authors: Ding, Y., Micheletto, R., Hanada, H., Nagamura, T., Okazaki, S.
Format: Article
Language:English
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Summary:This study describes a ground-breaking process that provides a direct highly localized measurement of the atomic mass on surfaces at room temperature. Employing an original system that joins a scanning tunneling microscopy (STM) device and a time-of-flight (TOF) mass analyzer, we could locally ionize surface atoms by the combination of an optical laser pulse and an appropriate voltage variation between the sample and the STM tip. Desorbed ions were accelerated and detected by a TOF chamber. Detection and discrimination of single atomic species from nanolocalized area have been demonstrated for the first time.
ISSN:0034-6748
1089-7623
DOI:10.1063/1.1499764