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High-temperature bulge-test setup for mechanical testing of free-standing thin films
We developed a bulge-test setup which enables measurement of the elastic and plastic properties of free-standing thin film samples between room temperature and at least 300 °C. Mechanical stress is applied to the film by a differential gas pressure across the sample and the bulge height is measured...
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Published in: | Review of scientific instruments 2003-03, Vol.74 (3), p.1383-1385 |
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Language: | English |
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container_issue | 3 |
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container_title | Review of scientific instruments |
container_volume | 74 |
creator | Kalkman, A. J. Verbruggen, A. H. Janssen, G. C. A. M. |
description | We developed a bulge-test setup which enables measurement of the elastic and plastic properties of free-standing thin film samples between room temperature and at least 300 °C. Mechanical stress is applied to the film by a differential gas pressure across the sample and the bulge height is measured by a scanning laser beam technique. To prevent sample oxidation the pressure cell containing the sample is mounted in a vacuum chamber. The correct operation of the setup is demonstrated by measurement of the thermal expansion of free-standing Al films. Creep experiments and tensile tests demonstrate measurement of the plastic deformation of these films at temperatures up to 200 °C. |
doi_str_mv | 10.1063/1.1539901 |
format | article |
fullrecord | <record><control><sourceid>scitation_cross</sourceid><recordid>TN_cdi_scitation_primary_10_1063_1_1539901</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>rsi</sourcerecordid><originalsourceid>FETCH-LOGICAL-c297t-848d9d4c24e23632bd31636783639b34b1667d06aa8bd6870db59710ff218a923</originalsourceid><addsrcrecordid>eNqdkEtLAzEUhYMoWKsL_0G2Cqm5yUweSylqhYKbuh4yk6QTmRdJKvjvndKCe-_mcM_5OIuD0D3QFVDBn2AFJdeawgVaAFWaSMH4JVpQygsiZKGu0U1KX3S-EmCBdpuwb0l2_eSiyYfocH3o9m52UsbJ5cOE_Rhx75rWDKExHT4mYdjj0WMfnSMpm8EejdyGAfvQ9ekWXXnTJXd31iX6fH3ZrTdk-_H2vn7ekoZpmYkqlNW2aFjhGBec1ZaD4EKq-dE1L2oQQloqjFG1FUpSW5daAvWegTKa8SV6OPU2cUwpOl9NMfQm_lRAq-McFVTnOWb28cSmJmSTwzj8D_4e4x9YTdbzX9NQbek</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype></control><display><type>article</type><title>High-temperature bulge-test setup for mechanical testing of free-standing thin films</title><source>American Institute of Physics (AIP) Publications</source><source>American Institute of Physics:Jisc Collections:Transitional Journals Agreement 2021-23 (Reading list)</source><creator>Kalkman, A. J. ; Verbruggen, A. H. ; Janssen, G. C. A. M.</creator><creatorcontrib>Kalkman, A. J. ; Verbruggen, A. H. ; Janssen, G. C. A. M.</creatorcontrib><description>We developed a bulge-test setup which enables measurement of the elastic and plastic properties of free-standing thin film samples between room temperature and at least 300 °C. Mechanical stress is applied to the film by a differential gas pressure across the sample and the bulge height is measured by a scanning laser beam technique. To prevent sample oxidation the pressure cell containing the sample is mounted in a vacuum chamber. The correct operation of the setup is demonstrated by measurement of the thermal expansion of free-standing Al films. Creep experiments and tensile tests demonstrate measurement of the plastic deformation of these films at temperatures up to 200 °C.</description><identifier>ISSN: 0034-6748</identifier><identifier>EISSN: 1089-7623</identifier><identifier>DOI: 10.1063/1.1539901</identifier><identifier>CODEN: RSINAK</identifier><language>eng</language><ispartof>Review of scientific instruments, 2003-03, Vol.74 (3), p.1383-1385</ispartof><rights>American Institute of Physics</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c297t-848d9d4c24e23632bd31636783639b34b1667d06aa8bd6870db59710ff218a923</citedby><cites>FETCH-LOGICAL-c297t-848d9d4c24e23632bd31636783639b34b1667d06aa8bd6870db59710ff218a923</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://pubs.aip.org/rsi/article-lookup/doi/10.1063/1.1539901$$EHTML$$P50$$Gscitation$$H</linktohtml><link.rule.ids>314,780,782,784,795,27924,27925,76383</link.rule.ids></links><search><creatorcontrib>Kalkman, A. J.</creatorcontrib><creatorcontrib>Verbruggen, A. H.</creatorcontrib><creatorcontrib>Janssen, G. C. A. M.</creatorcontrib><title>High-temperature bulge-test setup for mechanical testing of free-standing thin films</title><title>Review of scientific instruments</title><description>We developed a bulge-test setup which enables measurement of the elastic and plastic properties of free-standing thin film samples between room temperature and at least 300 °C. Mechanical stress is applied to the film by a differential gas pressure across the sample and the bulge height is measured by a scanning laser beam technique. To prevent sample oxidation the pressure cell containing the sample is mounted in a vacuum chamber. The correct operation of the setup is demonstrated by measurement of the thermal expansion of free-standing Al films. Creep experiments and tensile tests demonstrate measurement of the plastic deformation of these films at temperatures up to 200 °C.</description><issn>0034-6748</issn><issn>1089-7623</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2003</creationdate><recordtype>article</recordtype><recordid>eNqdkEtLAzEUhYMoWKsL_0G2Cqm5yUweSylqhYKbuh4yk6QTmRdJKvjvndKCe-_mcM_5OIuD0D3QFVDBn2AFJdeawgVaAFWaSMH4JVpQygsiZKGu0U1KX3S-EmCBdpuwb0l2_eSiyYfocH3o9m52UsbJ5cOE_Rhx75rWDKExHT4mYdjj0WMfnSMpm8EejdyGAfvQ9ekWXXnTJXd31iX6fH3ZrTdk-_H2vn7ekoZpmYkqlNW2aFjhGBec1ZaD4EKq-dE1L2oQQloqjFG1FUpSW5daAvWegTKa8SV6OPU2cUwpOl9NMfQm_lRAq-McFVTnOWb28cSmJmSTwzj8D_4e4x9YTdbzX9NQbek</recordid><startdate>200303</startdate><enddate>200303</enddate><creator>Kalkman, A. J.</creator><creator>Verbruggen, A. H.</creator><creator>Janssen, G. C. A. M.</creator><scope>AAYXX</scope><scope>CITATION</scope></search><sort><creationdate>200303</creationdate><title>High-temperature bulge-test setup for mechanical testing of free-standing thin films</title><author>Kalkman, A. J. ; Verbruggen, A. H. ; Janssen, G. C. A. M.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c297t-848d9d4c24e23632bd31636783639b34b1667d06aa8bd6870db59710ff218a923</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2003</creationdate><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Kalkman, A. J.</creatorcontrib><creatorcontrib>Verbruggen, A. H.</creatorcontrib><creatorcontrib>Janssen, G. C. A. M.</creatorcontrib><collection>CrossRef</collection><jtitle>Review of scientific instruments</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Kalkman, A. J.</au><au>Verbruggen, A. H.</au><au>Janssen, G. C. A. M.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>High-temperature bulge-test setup for mechanical testing of free-standing thin films</atitle><jtitle>Review of scientific instruments</jtitle><date>2003-03</date><risdate>2003</risdate><volume>74</volume><issue>3</issue><spage>1383</spage><epage>1385</epage><pages>1383-1385</pages><issn>0034-6748</issn><eissn>1089-7623</eissn><coden>RSINAK</coden><abstract>We developed a bulge-test setup which enables measurement of the elastic and plastic properties of free-standing thin film samples between room temperature and at least 300 °C. Mechanical stress is applied to the film by a differential gas pressure across the sample and the bulge height is measured by a scanning laser beam technique. To prevent sample oxidation the pressure cell containing the sample is mounted in a vacuum chamber. The correct operation of the setup is demonstrated by measurement of the thermal expansion of free-standing Al films. Creep experiments and tensile tests demonstrate measurement of the plastic deformation of these films at temperatures up to 200 °C.</abstract><doi>10.1063/1.1539901</doi><tpages>3</tpages></addata></record> |
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source | American Institute of Physics (AIP) Publications; American Institute of Physics:Jisc Collections:Transitional Journals Agreement 2021-23 (Reading list) |
title | High-temperature bulge-test setup for mechanical testing of free-standing thin films |
url | http://sfxeu10.hosted.exlibrisgroup.com/loughborough?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2024-12-24T17%3A11%3A43IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-scitation_cross&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=High-temperature%20bulge-test%20setup%20for%20mechanical%20testing%20of%20free-standing%20thin%20films&rft.jtitle=Review%20of%20scientific%20instruments&rft.au=Kalkman,%20A.%20J.&rft.date=2003-03&rft.volume=74&rft.issue=3&rft.spage=1383&rft.epage=1385&rft.pages=1383-1385&rft.issn=0034-6748&rft.eissn=1089-7623&rft.coden=RSINAK&rft_id=info:doi/10.1063/1.1539901&rft_dat=%3Cscitation_cross%3Ersi%3C/scitation_cross%3E%3Cgrp_id%3Ecdi_FETCH-LOGICAL-c297t-848d9d4c24e23632bd31636783639b34b1667d06aa8bd6870db59710ff218a923%3C/grp_id%3E%3Coa%3E%3C/oa%3E%3Curl%3E%3C/url%3E&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true |