Loading…
Circuit for the Display of Langmuir Probe Characteristics
The use of Langmuir probes for plasma measurements usually entails laborious graphical reduction of data to obtain the electron temperature, and errors are often introduced by drift in the plasma characteristics while the measurements are being taken. This paper describes a simple and accurate elect...
Saved in:
Published in: | Review of scientific instruments 1963-01, Vol.34 (4), p.416-420 |
---|---|
Main Author: | |
Format: | Article |
Language: | English |
Subjects: | |
Citations: | Items that this one cites Items that cite this one |
Online Access: | Get full text |
Tags: |
Add Tag
No Tags, Be the first to tag this record!
|
cited_by | cdi_FETCH-LOGICAL-c326t-ba5325587a559cee8c2f3411d128316940afdced12f7f7cd9d79c0bb1a732f8c3 |
---|---|
cites | cdi_FETCH-LOGICAL-c326t-ba5325587a559cee8c2f3411d128316940afdced12f7f7cd9d79c0bb1a732f8c3 |
container_end_page | 420 |
container_issue | 4 |
container_start_page | 416 |
container_title | Review of scientific instruments |
container_volume | 34 |
creator | Harp, R. S. |
description | The use of Langmuir probes for plasma measurements usually entails laborious graphical reduction of data to obtain the electron temperature, and errors are often introduced by drift in the plasma characteristics while the measurements are being taken. This paper describes a simple and accurate electronic device for reducing the probe data and displaying the results on an oscilloscope. The circuit employs commercially available plug‐in amplifiers to provide maximum ease of construction, and high accuracy is obtained with a minimum of calibration adjustments. |
doi_str_mv | 10.1063/1.1718384 |
format | article |
fullrecord | <record><control><sourceid>scitation_cross</sourceid><recordid>TN_cdi_scitation_primary_10_1063_1_1718384</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>rsi</sourcerecordid><originalsourceid>FETCH-LOGICAL-c326t-ba5325587a559cee8c2f3411d128316940afdced12f7f7cd9d79c0bb1a732f8c3</originalsourceid><addsrcrecordid>eNp90E1LAzEQBuAgCtbqwX8QvCmsZja7m-Qo6ycU9KDnkJ1NbKTdlCQV-u_d0qIHwbkMAw_vwEvIObBrYA2_gWsQILmsDsgEmFSFaEp-SCaM8apoRCWPyUlKn2ycGmBCVOsjrn2mLkSa55be-bRamA0Njs7M8LFc-0hfY-gsbecmGsw2-pQ9plNy5Mwi2bP9npL3h_u39qmYvTw-t7ezAnnZ5KIzNS_rWgpT1wqtlVg6XgH0UEoOjaqYcT3a8XTCCexVLxSyrgMjeOkk8im52OWG8a1O6LPFOYZhsJh11SgBpRrR5Q5hDClF6_Qq-qWJGw1Mb4vRoPfFjPZqZ7dZJvsw_OCvEH-hXvXuP_w3-RuqL3CB</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype></control><display><type>article</type><title>Circuit for the Display of Langmuir Probe Characteristics</title><source>American Institute of Physics</source><source>AIP Digital Archive</source><creator>Harp, R. S.</creator><creatorcontrib>Harp, R. S. ; Stanford Univ., Calif</creatorcontrib><description>The use of Langmuir probes for plasma measurements usually entails laborious graphical reduction of data to obtain the electron temperature, and errors are often introduced by drift in the plasma characteristics while the measurements are being taken. This paper describes a simple and accurate electronic device for reducing the probe data and displaying the results on an oscilloscope. The circuit employs commercially available plug‐in amplifiers to provide maximum ease of construction, and high accuracy is obtained with a minimum of calibration adjustments.</description><identifier>ISSN: 0034-6748</identifier><identifier>EISSN: 1089-7623</identifier><identifier>DOI: 10.1063/1.1718384</identifier><identifier>CODEN: RSINAK</identifier><language>eng</language><publisher>American Institute of Physics (AIP)</publisher><subject>INSTRUMENTS AND INSTRUMENTATION ; LANGMUIR PROBE ; PLASMA ; SAMPLING</subject><ispartof>Review of scientific instruments, 1963-01, Vol.34 (4), p.416-420</ispartof><rights>The American Institute of Physics</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c326t-ba5325587a559cee8c2f3411d128316940afdced12f7f7cd9d79c0bb1a732f8c3</citedby><cites>FETCH-LOGICAL-c326t-ba5325587a559cee8c2f3411d128316940afdced12f7f7cd9d79c0bb1a732f8c3</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://pubs.aip.org/rsi/article-lookup/doi/10.1063/1.1718384$$EHTML$$P50$$Gscitation$$H</linktohtml><link.rule.ids>230,314,776,778,780,791,881,1553,27901,27902,76126,76133</link.rule.ids><backlink>$$Uhttps://www.osti.gov/biblio/4697129$$D View this record in Osti.gov$$Hfree_for_read</backlink></links><search><creatorcontrib>Harp, R. S.</creatorcontrib><creatorcontrib>Stanford Univ., Calif</creatorcontrib><title>Circuit for the Display of Langmuir Probe Characteristics</title><title>Review of scientific instruments</title><description>The use of Langmuir probes for plasma measurements usually entails laborious graphical reduction of data to obtain the electron temperature, and errors are often introduced by drift in the plasma characteristics while the measurements are being taken. This paper describes a simple and accurate electronic device for reducing the probe data and displaying the results on an oscilloscope. The circuit employs commercially available plug‐in amplifiers to provide maximum ease of construction, and high accuracy is obtained with a minimum of calibration adjustments.</description><subject>INSTRUMENTS AND INSTRUMENTATION</subject><subject>LANGMUIR PROBE</subject><subject>PLASMA</subject><subject>SAMPLING</subject><issn>0034-6748</issn><issn>1089-7623</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>1963</creationdate><recordtype>article</recordtype><recordid>eNp90E1LAzEQBuAgCtbqwX8QvCmsZja7m-Qo6ycU9KDnkJ1NbKTdlCQV-u_d0qIHwbkMAw_vwEvIObBrYA2_gWsQILmsDsgEmFSFaEp-SCaM8apoRCWPyUlKn2ycGmBCVOsjrn2mLkSa55be-bRamA0Njs7M8LFc-0hfY-gsbecmGsw2-pQ9plNy5Mwi2bP9npL3h_u39qmYvTw-t7ezAnnZ5KIzNS_rWgpT1wqtlVg6XgH0UEoOjaqYcT3a8XTCCexVLxSyrgMjeOkk8im52OWG8a1O6LPFOYZhsJh11SgBpRrR5Q5hDClF6_Qq-qWJGw1Mb4vRoPfFjPZqZ7dZJvsw_OCvEH-hXvXuP_w3-RuqL3CB</recordid><startdate>19630101</startdate><enddate>19630101</enddate><creator>Harp, R. S.</creator><general>American Institute of Physics (AIP)</general><scope>AAYXX</scope><scope>CITATION</scope><scope>OTOTI</scope></search><sort><creationdate>19630101</creationdate><title>Circuit for the Display of Langmuir Probe Characteristics</title><author>Harp, R. S.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c326t-ba5325587a559cee8c2f3411d128316940afdced12f7f7cd9d79c0bb1a732f8c3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>1963</creationdate><topic>INSTRUMENTS AND INSTRUMENTATION</topic><topic>LANGMUIR PROBE</topic><topic>PLASMA</topic><topic>SAMPLING</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Harp, R. S.</creatorcontrib><creatorcontrib>Stanford Univ., Calif</creatorcontrib><collection>CrossRef</collection><collection>OSTI.GOV</collection><jtitle>Review of scientific instruments</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Harp, R. S.</au><aucorp>Stanford Univ., Calif</aucorp><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Circuit for the Display of Langmuir Probe Characteristics</atitle><jtitle>Review of scientific instruments</jtitle><date>1963-01-01</date><risdate>1963</risdate><volume>34</volume><issue>4</issue><spage>416</spage><epage>420</epage><pages>416-420</pages><issn>0034-6748</issn><eissn>1089-7623</eissn><coden>RSINAK</coden><abstract>The use of Langmuir probes for plasma measurements usually entails laborious graphical reduction of data to obtain the electron temperature, and errors are often introduced by drift in the plasma characteristics while the measurements are being taken. This paper describes a simple and accurate electronic device for reducing the probe data and displaying the results on an oscilloscope. The circuit employs commercially available plug‐in amplifiers to provide maximum ease of construction, and high accuracy is obtained with a minimum of calibration adjustments.</abstract><pub>American Institute of Physics (AIP)</pub><doi>10.1063/1.1718384</doi><tpages>5</tpages></addata></record> |
fulltext | fulltext |
identifier | ISSN: 0034-6748 |
ispartof | Review of scientific instruments, 1963-01, Vol.34 (4), p.416-420 |
issn | 0034-6748 1089-7623 |
language | eng |
recordid | cdi_scitation_primary_10_1063_1_1718384 |
source | American Institute of Physics; AIP Digital Archive |
subjects | INSTRUMENTS AND INSTRUMENTATION LANGMUIR PROBE PLASMA SAMPLING |
title | Circuit for the Display of Langmuir Probe Characteristics |
url | http://sfxeu10.hosted.exlibrisgroup.com/loughborough?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-31T04%3A58%3A08IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-scitation_cross&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Circuit%20for%20the%20Display%20of%20Langmuir%20Probe%20Characteristics&rft.jtitle=Review%20of%20scientific%20instruments&rft.au=Harp,%20R.%20S.&rft.aucorp=Stanford%20Univ.,%20Calif&rft.date=1963-01-01&rft.volume=34&rft.issue=4&rft.spage=416&rft.epage=420&rft.pages=416-420&rft.issn=0034-6748&rft.eissn=1089-7623&rft.coden=RSINAK&rft_id=info:doi/10.1063/1.1718384&rft_dat=%3Cscitation_cross%3Ersi%3C/scitation_cross%3E%3Cgrp_id%3Ecdi_FETCH-LOGICAL-c326t-ba5325587a559cee8c2f3411d128316940afdced12f7f7cd9d79c0bb1a732f8c3%3C/grp_id%3E%3Coa%3E%3C/oa%3E%3Curl%3E%3C/url%3E&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true |