Bakeable Microwave Cavity for Measurement of Electron Loss Rates in Photoionized Nitric Oxide

This paper describes the design and construction of an X‐band cavity resonator equipped with a variable microwave coupling device for use in the study of electron loss processes in nitric oxide plasmas. A lithium fluoride window is provided to permit plasma production by ultraviolet irradiation down...

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Bibliographic Details
Published in:Review of scientific instruments 1965-04, Vol.36 (4), p.478-480
Main Authors: Shaw, T. M., Brooks, G. H., Gunton, R. C.
Format: Article
Language:English
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Summary:This paper describes the design and construction of an X‐band cavity resonator equipped with a variable microwave coupling device for use in the study of electron loss processes in nitric oxide plasmas. A lithium fluoride window is provided to permit plasma production by ultraviolet irradiation down to 1100 Å. The cavity is suitable for use with ultrahigh vacuum systems and can be outgassed by baking at temperatures up to 350°C.
ISSN:0034-6748
1089-7623
DOI:10.1063/1.1719603