Bakeable Microwave Cavity for Measurement of Electron Loss Rates in Photoionized Nitric Oxide

This paper describes the design and construction of an X‐band cavity resonator equipped with a variable microwave coupling device for use in the study of electron loss processes in nitric oxide plasmas. A lithium fluoride window is provided to permit plasma production by ultraviolet irradiation down...

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Published in:Review of scientific instruments 1965-04, Vol.36 (4), p.478-480
Main Authors: Shaw, T. M., Brooks, G. H., Gunton, R. C.
Format: Article
Language:English
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cited_by cdi_FETCH-LOGICAL-c299t-e3b3fe368c5e327880fffde6058058b7fd4448bb44cee1a0fd4cbbaa6f4971f53
cites cdi_FETCH-LOGICAL-c299t-e3b3fe368c5e327880fffde6058058b7fd4448bb44cee1a0fd4cbbaa6f4971f53
container_end_page 480
container_issue 4
container_start_page 478
container_title Review of scientific instruments
container_volume 36
creator Shaw, T. M.
Brooks, G. H.
Gunton, R. C.
description This paper describes the design and construction of an X‐band cavity resonator equipped with a variable microwave coupling device for use in the study of electron loss processes in nitric oxide plasmas. A lithium fluoride window is provided to permit plasma production by ultraviolet irradiation down to 1100 Å. The cavity is suitable for use with ultrahigh vacuum systems and can be outgassed by baking at temperatures up to 350°C.
doi_str_mv 10.1063/1.1719603
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fullrecord <record><control><sourceid>scitation_cross</sourceid><recordid>TN_cdi_scitation_primary_10_1063_1_1719603</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>rsi</sourcerecordid><originalsourceid>FETCH-LOGICAL-c299t-e3b3fe368c5e327880fffde6058058b7fd4448bb44cee1a0fd4cbbaa6f4971f53</originalsourceid><addsrcrecordid>eNqdkF9LwzAUxYMoOKcPfoO8KnQmTZqmjzrmH-iciD5KSdIbjG7NSGJ1fnorG_ju5cLlwI_LOQehU0omlAh2QSe0pJUgbA-NKJFVVoqc7aMRIYxnouTyEB3F-EaGKSgdoZcr9Q5KLwHPnQn-U_WAp6p3aYOtD3gOKn4EWEGXsLd4tgSTgu9w7WPEjypBxK7DD68-eec79w0tvncpOIMXX66FY3Rg1TLCye6O0fP17Gl6m9WLm7vpZZ2ZvKpSBkwzC0xIUwDLSymJtbYFQQo5rC5tyzmXWnNuAKgigzZaKyUsr0pqCzZGZ9u_Q4QYA9hmHdxKhU1DSfPbS0ObXS8De75lo3FJpcH2_-Dehz-wWbeW_QD_I3Kc</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype></control><display><type>article</type><title>Bakeable Microwave Cavity for Measurement of Electron Loss Rates in Photoionized Nitric Oxide</title><source>American Institute of Physics (AIP) Publications</source><source>AIP Digital Archive</source><creator>Shaw, T. M. ; Brooks, G. H. ; Gunton, R. C.</creator><creatorcontrib>Shaw, T. M. ; Brooks, G. H. ; Gunton, R. C.</creatorcontrib><description>This paper describes the design and construction of an X‐band cavity resonator equipped with a variable microwave coupling device for use in the study of electron loss processes in nitric oxide plasmas. A lithium fluoride window is provided to permit plasma production by ultraviolet irradiation down to 1100 Å. The cavity is suitable for use with ultrahigh vacuum systems and can be outgassed by baking at temperatures up to 350°C.</description><identifier>ISSN: 0034-6748</identifier><identifier>EISSN: 1089-7623</identifier><identifier>DOI: 10.1063/1.1719603</identifier><identifier>CODEN: RSINAK</identifier><language>eng</language><ispartof>Review of scientific instruments, 1965-04, Vol.36 (4), p.478-480</ispartof><rights>The American Institute of Physics</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c299t-e3b3fe368c5e327880fffde6058058b7fd4448bb44cee1a0fd4cbbaa6f4971f53</citedby><cites>FETCH-LOGICAL-c299t-e3b3fe368c5e327880fffde6058058b7fd4448bb44cee1a0fd4cbbaa6f4971f53</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://pubs.aip.org/rsi/article-lookup/doi/10.1063/1.1719603$$EHTML$$P50$$Gscitation$$H</linktohtml><link.rule.ids>314,780,782,784,795,1558,27922,27923,76153,76160</link.rule.ids></links><search><creatorcontrib>Shaw, T. M.</creatorcontrib><creatorcontrib>Brooks, G. H.</creatorcontrib><creatorcontrib>Gunton, R. C.</creatorcontrib><title>Bakeable Microwave Cavity for Measurement of Electron Loss Rates in Photoionized Nitric Oxide</title><title>Review of scientific instruments</title><description>This paper describes the design and construction of an X‐band cavity resonator equipped with a variable microwave coupling device for use in the study of electron loss processes in nitric oxide plasmas. A lithium fluoride window is provided to permit plasma production by ultraviolet irradiation down to 1100 Å. The cavity is suitable for use with ultrahigh vacuum systems and can be outgassed by baking at temperatures up to 350°C.</description><issn>0034-6748</issn><issn>1089-7623</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>1965</creationdate><recordtype>article</recordtype><recordid>eNqdkF9LwzAUxYMoOKcPfoO8KnQmTZqmjzrmH-iciD5KSdIbjG7NSGJ1fnorG_ju5cLlwI_LOQehU0omlAh2QSe0pJUgbA-NKJFVVoqc7aMRIYxnouTyEB3F-EaGKSgdoZcr9Q5KLwHPnQn-U_WAp6p3aYOtD3gOKn4EWEGXsLd4tgSTgu9w7WPEjypBxK7DD68-eec79w0tvncpOIMXX66FY3Rg1TLCye6O0fP17Gl6m9WLm7vpZZ2ZvKpSBkwzC0xIUwDLSymJtbYFQQo5rC5tyzmXWnNuAKgigzZaKyUsr0pqCzZGZ9u_Q4QYA9hmHdxKhU1DSfPbS0ObXS8De75lo3FJpcH2_-Dehz-wWbeW_QD_I3Kc</recordid><startdate>196504</startdate><enddate>196504</enddate><creator>Shaw, T. M.</creator><creator>Brooks, G. H.</creator><creator>Gunton, R. C.</creator><scope>AAYXX</scope><scope>CITATION</scope></search><sort><creationdate>196504</creationdate><title>Bakeable Microwave Cavity for Measurement of Electron Loss Rates in Photoionized Nitric Oxide</title><author>Shaw, T. M. ; Brooks, G. H. ; Gunton, R. C.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c299t-e3b3fe368c5e327880fffde6058058b7fd4448bb44cee1a0fd4cbbaa6f4971f53</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>1965</creationdate><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Shaw, T. M.</creatorcontrib><creatorcontrib>Brooks, G. H.</creatorcontrib><creatorcontrib>Gunton, R. C.</creatorcontrib><collection>CrossRef</collection><jtitle>Review of scientific instruments</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Shaw, T. M.</au><au>Brooks, G. H.</au><au>Gunton, R. C.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Bakeable Microwave Cavity for Measurement of Electron Loss Rates in Photoionized Nitric Oxide</atitle><jtitle>Review of scientific instruments</jtitle><date>1965-04</date><risdate>1965</risdate><volume>36</volume><issue>4</issue><spage>478</spage><epage>480</epage><pages>478-480</pages><issn>0034-6748</issn><eissn>1089-7623</eissn><coden>RSINAK</coden><abstract>This paper describes the design and construction of an X‐band cavity resonator equipped with a variable microwave coupling device for use in the study of electron loss processes in nitric oxide plasmas. A lithium fluoride window is provided to permit plasma production by ultraviolet irradiation down to 1100 Å. The cavity is suitable for use with ultrahigh vacuum systems and can be outgassed by baking at temperatures up to 350°C.</abstract><doi>10.1063/1.1719603</doi><tpages>3</tpages></addata></record>
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identifier ISSN: 0034-6748
ispartof Review of scientific instruments, 1965-04, Vol.36 (4), p.478-480
issn 0034-6748
1089-7623
language eng
recordid cdi_scitation_primary_10_1063_1_1719603
source American Institute of Physics (AIP) Publications; AIP Digital Archive
title Bakeable Microwave Cavity for Measurement of Electron Loss Rates in Photoionized Nitric Oxide
url http://sfxeu10.hosted.exlibrisgroup.com/loughborough?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-13T19%3A41%3A09IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-scitation_cross&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Bakeable%20Microwave%20Cavity%20for%20Measurement%20of%20Electron%20Loss%20Rates%20in%20Photoionized%20Nitric%20Oxide&rft.jtitle=Review%20of%20scientific%20instruments&rft.au=Shaw,%20T.%20M.&rft.date=1965-04&rft.volume=36&rft.issue=4&rft.spage=478&rft.epage=480&rft.pages=478-480&rft.issn=0034-6748&rft.eissn=1089-7623&rft.coden=RSINAK&rft_id=info:doi/10.1063/1.1719603&rft_dat=%3Cscitation_cross%3Ersi%3C/scitation_cross%3E%3Cgrp_id%3Ecdi_FETCH-LOGICAL-c299t-e3b3fe368c5e327880fffde6058058b7fd4448bb44cee1a0fd4cbbaa6f4971f53%3C/grp_id%3E%3Coa%3E%3C/oa%3E%3Curl%3E%3C/url%3E&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true