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Time and temperature dependencies of imprint characteristicsin SrBi 2 Ta 2 O 9 capacitors
The temperature dependence of imprint characteristics in SrBi 2 Ta 2 O 9 capacitors has been investigated by monitoring changes in switching charges ( Δ Q ) and hysteresis shifts ( Δ V ) . Activation energies E a and E a ′ were obtained from Δ Q and Δ V , respectively, E a = 0.34 and E a ′ = 0.14 eV...
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| Published in: | Applied physics letters 2005-04, Vol.86 (16), p.162901-162901-2 |
|---|---|
| Main Authors: | , , , |
| Format: | Article |
| Language: | |
| Citations: | Items that this one cites |
| Online Access: | Get full text |
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| Summary: | The temperature dependence of imprint characteristics in
SrBi
2
Ta
2
O
9
capacitors has been investigated by monitoring changes in switching charges
(
Δ
Q
)
and hysteresis shifts
(
Δ
V
)
. Activation energies
E
a
and
E
a
′
were obtained from
Δ
Q
and
Δ
V
, respectively,
E
a
=
0.34
and
E
a
′
=
0.14
eV
. The origin of this discrepancy is due to the fact that the relationship between
Δ
Q
and
Δ
V
is not linear, and because the dependence of
Δ
Q
on temperature is overestimated because of the seeming dependence. It is concluded that a detailed investigation of hysteresis shifts is necessary for precise discussions of imprint mechanisms in ferroelectric capacitors. |
|---|---|
| ISSN: | 0003-6951 1077-3118 |
| DOI: | 10.1063/1.1901821 |