Nanopositioning system for macroscopic components based on shear-force detection

We present and describe an alternative device for positioning two massive optical elements at distances smaller than 1 μ m to each other. The developed technique is derived from the conventional nonoptical shear-force distance control usually used in scanning near-field optical microscopy (SNOM). It...

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Bibliographic Details
Published in:Review of scientific instruments 2005-09, Vol.76 (9)
Main Authors: Grosjean, T., Fahys, A., Courjon, D.
Format: Article
Language:English
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Summary:We present and describe an alternative device for positioning two massive optical elements at distances smaller than 1 μ m to each other. The developed technique is derived from the conventional nonoptical shear-force distance control usually used in scanning near-field optical microscopy (SNOM). It is suitable whatever the nature of the involved elements (metal, semiconductor, or dielectric) and is well adapted to solid immersion microscopy and virtual tip near-field microscopy.
ISSN:0034-6748
1089-7623
DOI:10.1063/1.2040208