A survey of anisotropy measurement techniques and studyof thickness effect on interfacial and volume anisotropiesin Co ∕ Pt multilayer media

• Published in: Journal of applied physics 2006-04, Vol.99 (8), p.08E918-08E918-3
• Main Authors: Guo, Vickie W., Lu, Bin, Wu, Xiaowei, Ju, Ganping, Valcu, Bogdan, Weller, Dieter
• Format: Article
• ISSN: 0021-8979; 1089-7550
• DOI: 10.1063/1.2169540

A survey of various measurement techniques, including the rotation method, the hard-axis hysteresis loop, and the torque measurement, is presented using Co ∕ Pt multilayer recording media. It is found that for highly exchange-coupled samples, the results from the rotational method are consistent with those from the hard-axis hysteresis loop and torque measurements. Such anisotropy measurements are applied to determine the interfacial anisotropy in Co ∕ Pt multilayers (MLs) by studying a series of Co ∕ Pt ML samples with Co thickness ranging from 0.1 to 2 nm. The Pt thickness is fixed at either 1 or 0.5 nm. It is found that the multilayer with 1 nm Pt layer shows a larger interfacial anisotropy constant ( K S ∼ 0.8 erg ∕ cm 2 ) than the media with 0.5 nm Pt layer ( K S ∼ 0.6 erg ∕ cm 2 ) , corresponding to about 80% and 60% of the interfacial anisotropy of the ML made by molecular-beam epitaxy, respectively [ D. Weller , Mater. Res. Soc. Symp. Proc. 313 , 791 ( 1993 ) ]. Such thickness dependence is supported by the x-ray-diffraction superlattice peak measurements that indicate the discontinuous growth for the case with thinner Pt.