Magnetic depth profiles from resonant soft x-ray scattering: Applicationto Dy thin films

We employ the strong variation of the photon penetration depth across an electronic resonance in soft x-ray scattering for a depth resolved study of an antiferromagnetic (AFM) thin film. We directly observed the development of the helical AFM structure in thin Dy(001) films on W(110) across the temp...

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Bibliographic Details
Published in:Applied physics letters 2006-05, Vol.88 (21), p.212507-212507-3
Main Authors: Ott, H., Schüβler-Langeheine, C., Schierle, E., Kaindl, G., Weschke, E.
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Summary:We employ the strong variation of the photon penetration depth across an electronic resonance in soft x-ray scattering for a depth resolved study of an antiferromagnetic (AFM) thin film. We directly observed the development of the helical AFM structure in thin Dy(001) films on W(110) across the temperature-induced phase transition from ferromagnetic to helical AFM order.
ISSN:0003-6951
1077-3118
DOI:10.1063/1.2206699