Atomic force microscopy: Loading position dependence of cantilever spring constants and detector sensitivity

A simple and accurate experimental method is described for determining the effective cantilever spring constant and the detector sensitivity of atomic force microscopy cantilevers on which a colloidal particle is attached. By attaching large (approximately 85 μ m diameter) latex particles at various...

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Bibliographic Details
Published in:Review of scientific instruments 2007-11, Vol.78 (11), p.116102-116102-3
Main Authors: Vakarelski, Ivan U., Edwards, Scott A., Dagastine, Raymond R., Chan, Derek Y. C., Stevens, Geoffrey W., Grieser, Franz
Format: Article
Language:English
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Summary:A simple and accurate experimental method is described for determining the effective cantilever spring constant and the detector sensitivity of atomic force microscopy cantilevers on which a colloidal particle is attached. By attaching large (approximately 85 μ m diameter) latex particles at various positions along the V-shaped cantilevers, we demonstrate how the normal and lateral spring constants as well as the sensitivity vary with loading position. Comparison with an explicit point-load theoretical model has also been used to verify the accuracy of the method.
ISSN:0034-6748
1089-7623
DOI:10.1063/1.2805518