A Seeman-Bohlin geometry for high-resolution nanosecondx-ray diffraction measurements from shocked polycrystalline and amorphous materials

• Published in: Review of scientific instruments 2009-09, Vol.80 (9), p.093904-093904-7
• Main Authors: Milathianaki, D., Hawreliak, J., McNaney, J. M., El-Dasher, B. S., Saculla, M. D., Swift, D. C., Lorenzana, H. E., Ditmire, T.
• Format: Article
• ISSN: 0034-6748; 1089-7623
• DOI: 10.1063/1.3230647

We report on a focusing x-ray diffraction geometry capable of high-resolution in situ lattice probing from dynamically loaded polycrystalline and amorphous materials. The Seeman-Bohlin-type camera presented here is ideally suited for time-resolved x-ray diffraction measurements performed on high energy multibeam laser platforms. Diffraction from several lattice planes of ablatively shock-loaded 25   μ m thick Cu foils was recorded on a focusing circle of diameter D = 100   mm with exceptional angular resolution limited only by the spectral broadening of the x-ray source. Excellent agreement was found between the density measured using x-ray diffraction and that inferred from Doppler velocimetry and the known shock Hugoniot of Cu. In addition, x-ray diffraction signal was captured from an amorphous material under static conditions.