High-resolution friction force microscopy under electrochemical control

We report the design and development of a friction force microscope for high-resolution studies in electrochemical environments. The design choices are motivated by the experimental requirements of atomic-scale friction measurements in liquids. The noise of the system is analyzed based on a methodol...

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Bibliographic Details
Published in:Review of scientific instruments 2010-08, Vol.81 (8), p.083701-083701-11
Main Authors: Labuda, Aleksander, Paul, William, Pietrobon, Brendan, Lennox, R. Bruce, Grütter, Peter H., Bennewitz, Roland
Format: Article
Language:English
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Summary:We report the design and development of a friction force microscope for high-resolution studies in electrochemical environments. The design choices are motivated by the experimental requirements of atomic-scale friction measurements in liquids. The noise of the system is analyzed based on a methodology for the quantification of all the noise sources. The quantitative contribution of each noise source is analyzed in a series of lateral force measurements. Normal force detection is demonstrated in a study of the solvation potential in a confined liquid, octamethylcyclotetrasiloxane. The limitations of the timing resolution of the instrument are discussed in the context of an atomic stick-slip measurement. The instrument is capable of studying the atomic friction contrast between a bare Au(111) surface and a copper monolayer deposited at underpotential conditions in perchloric acid.
ISSN:0034-6748
1089-7623
DOI:10.1063/1.3470107