Loading…

Structural, Dielectric, FT‐IR and Complex Impedance Properties of Cobalt Ferrite Nanoparticles

Cobalt ferrite nanoparticles having the general formula CoFe 2− x Cu x O 4 (0.0 ≤ x ≤ 0.5) were prepared by sol‐gel method and characterized by using X‐Ray diffraction (XRD), scanning electron microscopy (SEM ), Fourier transform infrared spectroscopy (FTIR), dielectric and impedance spectroscopy me...

Full description

Saved in:
Bibliographic Details
Main Authors: Hashim, Mohd, Alimuddin, Ali, Sikander, Kumar, Shalendra, Kumar, Ravi
Format: Conference Proceeding
Language:English
Online Access:Get full text
Tags: Add Tag
No Tags, Be the first to tag this record!
Description
Summary:Cobalt ferrite nanoparticles having the general formula CoFe 2− x Cu x O 4 (0.0 ≤ x ≤ 0.5) were prepared by sol‐gel method and characterized by using X‐Ray diffraction (XRD), scanning electron microscopy (SEM ), Fourier transform infrared spectroscopy (FTIR), dielectric and impedance spectroscopy measurements. Confirmation of the single phase cubic spinel structure was made by using X‐ray diffractometer. Lattice parameter ‘a’ is found to decrease with increasing the doping contents. Debye‐ Scherer formula was used for finding the particle size and found in the range 30–45 nm. Morphological analysis was made by scanning electron microscopy which shows agglomerated flakes of particles having large pores on the surface. FT‐IR spectra show two absorption bands assigned to the tetrahedral and octahedral complexes in the frequency range 400–600  cm −1 . The variation of dielectric properties ε′, ε, tanδ with frequency reveals that the dispersion is due to Maxwell‐Wagner type of interfacial polarization. Impedance spectroscopy technique has been used to understand the conduction mechanism and to study the effect of grain and grain boundary on the electrical properties of the Cu doped CoFe 2 O 4 ferrites.
ISSN:0094-243X
1551-7616
DOI:10.1063/1.3644444