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Structural, Dielectric, FT‐IR and Complex Impedance Properties of Cobalt Ferrite Nanoparticles
Cobalt ferrite nanoparticles having the general formula CoFe 2− x Cu x O 4 (0.0 ≤ x ≤ 0.5) were prepared by sol‐gel method and characterized by using X‐Ray diffraction (XRD), scanning electron microscopy (SEM ), Fourier transform infrared spectroscopy (FTIR), dielectric and impedance spectroscopy me...
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Main Authors: | , , , , |
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Format: | Conference Proceeding |
Language: | English |
Online Access: | Get full text |
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Summary: | Cobalt
ferrite
nanoparticles
having the general formula
CoFe
2−
x
Cu
x
O
4
(0.0 ≤ x ≤ 0.5) were prepared by sol‐gel method and characterized by using X‐Ray
diffraction
(XRD),
scanning electron
microscopy
(SEM ),
Fourier transform infrared
spectroscopy
(FTIR),
dielectric and
impedance spectroscopy measurements. Confirmation of the single phase cubic
spinel structure was made by using X‐ray diffractometer. Lattice parameter ‘a’ is found to decrease
with increasing the doping contents. Debye‐ Scherer formula was used for finding the
particle size and found in the range 30–45 nm. Morphological analysis was made by
scanning electron
microscopy which shows agglomerated flakes of particles having large
pores on the surface. FT‐IR spectra show two absorption bands assigned to the tetrahedral
and octahedral complexes in the frequency range
400–600
cm
−1
.
The variation of dielectric
properties ε′, ε, tanδ with frequency reveals that the dispersion is due
to Maxwell‐Wagner type of interfacial polarization. Impedance spectroscopy technique has been
used to understand the conduction mechanism and to study the effect of grain and grain
boundary on the electrical properties of the Cu
doped
CoFe
2
O
4
ferrites. |
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ISSN: | 0094-243X 1551-7616 |
DOI: | 10.1063/1.3644444 |