Temperature-dependent spin injection dynamics in InGaAs/GaAs quantum well-dot tunnel-coupled nanostructures

Time-resolved optical spin orientation spectroscopy was employed to investigate the temperature-dependent electron spin injection in In0.1Ga0.9As quantum well (QW) and In0.5Ga0.5As quantum dots (QDs) tunnel-coupled nanostructures with 4, 6, and 8 nm-thick GaAs barriers. The fast picosecond-ranged sp...

Full description

Saved in:
Bibliographic Details
Published in:Applied physics letters 2016-03, Vol.119 (11)
Main Authors: Chen, S. L., Kiba, T., Yang, X. J., Takayama, J., Murayama, A.
Format: Article
Language:English
Subjects:
Applied physics
CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS
CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY
Electron spin
ELECTRONS
EXCITED STATES
Gallium arsenide
GALLIUM ARSENIDES
High temperature
INDIUM ARSENIDES
Indium gallium arsenides
INJECTION
MULTIPLE SCATTERING
Nanostructure
PHONONS
QUANTUM DOTS
QUANTUM WELLS
RELAXATION
SPIN
Spin dynamics
SPIN ORIENTATION
TEMPERATURE DEPENDENCE
Thermal stability
TIME RESOLUTION
VELOCITY
Citations: Items that this one cites
Items that cite this one
Online Access:Get full text
Tags: Add Tag
No Tags, Be the first to tag this record!
Description
Summary:Time-resolved optical spin orientation spectroscopy was employed to investigate the temperature-dependent electron spin injection in In0.1Ga0.9As quantum well (QW) and In0.5Ga0.5As quantum dots (QDs) tunnel-coupled nanostructures with 4, 6, and 8 nm-thick GaAs barriers. The fast picosecond-ranged spin injection from QW to QD excited states (ES) was observed to speed up with temperature, as induced by pronounced longitudinal-optical (LO)-phonon-involved multiple scattering process, which contributes to a thermally stable and almost fully spin-conserving injection within 5–180 K. The LO-phonon coupling was also found to cause accelerated electron spin relaxation of QD ES at elevated temperature, mainly via hyperfine interaction with random nuclear field.
ISSN:0021-8979
0003-6951
1077-3118
1089-7550
DOI:10.1063/1.4944039