Publisher’s Note: “Evaluation of a flat-field grazing incidence spectrometer for highly charged ion plasma emission in soft x-ray spectral region from 1 to 10 nm” [Rev. Sci. Instrum. 87, 123106 (2016)]

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Bibliographic Details
Published in:Review of scientific instruments 2017-02, Vol.88 (2), p.029902-029902
Main Authors: Dinh, Thanh Hung, Kondo, Yoshiki, Tamura, Toshiki, Ono, Yuichi, Hara, Hiroyuki, Oikawa, Hiroki, Yamamoto, Yoichi, Ishino, Masahiko, Nishikino, Masaharu, Makimura, Tetsuya, Dunne, Padraig, O’Sullivan, Gerry, Ohta, Shigeru, Kitano, Ken, Ejima, Takeo, Hatano, Tadashi, Higashiguchi, Takeshi
Format: Article
Language:English
Subjects:
Ions
Scientific apparatus & instruments
Soft x rays
X ray spectra
Online Access:Get full text
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ISSN:0034-6748
1089-7623
DOI:10.1063/1.4973926