Optical characterization of polar HfO2 nanoparticles in the mid- and far-infrared

Monoclinic HfO2 nanoparticles with nominal diameters of 9, 30, and 45 nm are characterized using transmission and reflection spectroscopy from the mid- to far-infrared. Phonon modes are identified in the measured spectra and agree with previously reported values in HfO2 thin films and density functi...

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Bibliographic Details
Published in:Applied physics letters 2017-07, Vol.111 (1)
Main Authors: Dominguez, O., McGinnity, T. L., Roeder, R. K., Hoffman, A. J.
Format: Article
Language:English
Subjects:
Applied physics
Far infrared radiation
Hafnium oxide
Mathematical models
Nanoparticles
Optical properties
Perturbation methods
Perturbation theory
Polaritons
Reflection
Spectrum analysis
Thin films
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Summary:Monoclinic HfO2 nanoparticles with nominal diameters of 9, 30, and 45 nm are characterized using transmission and reflection spectroscopy from the mid- to far-infrared. Phonon modes are identified in the measured spectra and agree with previously reported values in HfO2 thin films and density functional perturbation theory calculations. An anomaly in both reflection and transmission is observed at 556 cm−1 that is not attributed to the optical phonon modes. Numerical models predict a localized surface phonon polariton mode near this frequency, and we attribute the anomaly to coupling to this surface mode. The results of this work suggest that HfO2 nanoparticles could enable engineered optical properties in new mid- and far-infrared materials and devices.
ISSN:0003-6951
1077-3118
DOI:10.1063/1.4991544