Selective sensitivity in Kerr microscopy

A new technique for contrast separation in wide-field magneto-optical Kerr microscopy is introduced. Utilizing the light from eight light emitting diodes, guided to the microscope by glass fibers and being switched synchronously with the camera exposure, domain images with orthogonal in-plane sensit...

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Bibliographic Details
Published in:Review of scientific instruments 2017-07, Vol.88 (7), p.073701-073701
Main Authors: Soldatov, I. V., Schäfer, R.
Format: Article
Language:English
Subjects:
Ferrous alloys
Glass fibers
Image contrast
Light emitting diodes
Magnetic alloys
Microscopy
Organic light emitting diodes
Scientific apparatus & instruments
Sensitivity enhancement
Separation
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Summary:A new technique for contrast separation in wide-field magneto-optical Kerr microscopy is introduced. Utilizing the light from eight light emitting diodes, guided to the microscope by glass fibers and being switched synchronously with the camera exposure, domain images with orthogonal in-plane sensitivity can be displayed simultaneously at real-time, and images with pure in-plane or polar contrast can be obtained. The benefit of this new method of contrast separation is demonstrated for Permalloy films, a NdFeB sinter magnet, and a cobalt crystal. Moreover, the new technique is shown to strongly enhance the sensitivity of Kerr microscopy by eliminating parasitic contrast contributions occurring in conventional setups. A doubling of the in-plane domain contrast and a sensitivity to Kerr rotations as low as 0.6 mdeg is demonstrated.
ISSN:0034-6748
1089-7623
DOI:10.1063/1.4991820