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Development of the device for measuring the thickness of a quasi-liquid layer on the ice surface

Ice has unusual surface properties, which are explained by the existence of a quasi-liquid layer on its surface. Despite a large number of studies, it has not been possible to determine the exact dependence of the quasi-liquid layer thickness on temperature. This article analyzes the possibility of...

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Bibliographic Details
Main Authors: Ostrovsky, Vasily, Tyagunin, Anatoliy, Orlov, Alexey
Format: Conference Proceeding
Language:English
Subjects:
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Summary:Ice has unusual surface properties, which are explained by the existence of a quasi-liquid layer on its surface. Despite a large number of studies, it has not been possible to determine the exact dependence of the quasi-liquid layer thickness on temperature. This article analyzes the possibility of measuring the thickness of the quasi-liquid layer by interference method, and presents a model of the experimental device.
ISSN:0094-243X
1551-7616
DOI:10.1063/1.5055140