Micro-crystal x-ray diffraction beamline - Advanced and non-ambient crystallography

• Main Authors: Wu, Lai-Chin, Lee, Jey-Jau, Chang, Shih-Hung, Lee, Ming-Han, Liao, Bo-Yi
• Format: Conference Proceeding
• Language: English
• Subjects: Crystallography; Crystals; Data acquisition; Microcrystals; Multilayers; Organic chemistry; Stations; X-ray diffraction
• ISSN: 0094-243X; 1551-7616
• DOI: 10.1063/1.5084660

A dedicated X-ray diffraction beamline “Micro-crystal X-ray diffraction beamline (μ-XRD)” for advanced and non-ambient crystallography of chemical crystal research are scheduled at TPS 15A, a Phase-II beamline at TPS (Taiwan Photon Source). The beamline consists of a tapered cryogenic undulator source (CUT15), a coupled Double Crystal Monochromator (DCM) / Double Multilayer Monochromator (DMM) system, three focusing mirrors (HFM1, VFM, and HFM2) and two end-stations (ES1 and ES2). CUT15 will generate high brilliance X-ray, the designed available energy range 9 – 35 keV. The X-ray beam is focused by HFM1 and delivered to ES1 with adjustable beam size 100 – 200 µm2; then X-ray is focused again by a pair of Kirkpatrick-Baez (KB) mirror (VFM and HFM2) down to ∼ 2 µm2 (FWHM) in diameter at the sample position of ES2. Experiments can be conducted in either monochromatic (by DCM) or pink (by DMM width bandwidth 3-5 %) beam mode in both end-stations. A set of instrument, including the high-heat-load chopper, millisecond shutter, and a high-speed Jülich chopper,1 are synchronized to the storage ring clock, which will be used to isolate a single X-ray pulse (< 100 ps) and deliver to the sample at ES2. Both end-stations will equip with a high precision kappa geometry goniometer and a large and fast area detector for data collection.