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Core loss calculation for power electronics converter excitation from a sinusoidal excited core loss data
The authors propose a core loss calculation method for power electronics converter excitation from sinusoidal excited core loss data. This method is based on Brockmeyer’s theory and adapts to calculate core loss under DC-bias excitation conditions. Furthermore, the number of core loss test condition...
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Published in: | AIP advances 2020-04, Vol.10 (4), p.045001-045001-4 |
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cited_by | cdi_FETCH-LOGICAL-c494t-9e6ba08da08f3533363a930b7cc82a8cf408ac02c58b36351d905d6e432fe3103 |
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container_end_page | 045001-4 |
container_issue | 4 |
container_start_page | 045001 |
container_title | AIP advances |
container_volume | 10 |
creator | Matsumori, Hiroaki Shimizu, Toshihisa Kosaka, Takashi Matsui, Nobuyuki |
description | The authors propose a core loss calculation method for power electronics converter excitation from sinusoidal excited core loss data. This method is based on Brockmeyer’s theory and adapts to calculate core loss under DC-bias excitation conditions. Furthermore, the number of core loss test conditions are reduced as this method only requires the addition of DC-bias characteristics to the sinusoidal excitation core loss data provided by the core manufacturers. To validate the proposed method, the core losses under sinusoidal and square voltage excitations are first measured by a BH analyzer with a DC-bias excitation unit. Then, the measured values under a square voltage excitation and the calculated values from a sinusoidal excited core loss data are compared. |
doi_str_mv | 10.1063/1.5129419 |
format | article |
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Then, the measured values under a square voltage excitation and the calculated values from a sinusoidal excited core loss data are compared.</description><subject>Bias</subject><subject>Converters</subject><subject>Core loss</subject><subject>Electric potential</subject><subject>Electronics</subject><subject>Excitation</subject><subject>Mathematical analysis</subject><subject>Voltage</subject><issn>2158-3226</issn><issn>2158-3226</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2020</creationdate><recordtype>article</recordtype><sourceid>AJDQP</sourceid><sourceid>DOA</sourceid><recordid>eNp9kd9LwzAQgIMoOOYe_A8KPil0Jk3Spo8y_DEY-KLP4ZomktE1M2mn_vemdlNBMBBy3H18l-QQOid4TnBOr8mck6xkpDxCk4xwkdIsy49_xadoFsIax8VKggWbILtwXieNCyFR0Ki-gc66NjHOJ1v3pn2iG60671qrIuHanfbdkH1Xttuj3m0SSIJt--BsDc1Y1HXED-oaOjhDJwaaoGf7c4qe726fFg_p6vF-ubhZpYqVrEtLnVeARR23oZxSmlMoKa4KpUQGQhmGBSicKS6qWOOkLjGvc81oZjQlmE7RcvTWDtZy6-0G_Id0YOVXwvkXCb6zqtGy4qzgxSDFwKqcg8pBiHwIjSkMi66L0bX17rXXoZNr1_s2Xl9mVHDMC0xJpC5HSvn4WK_Nd1eC5TAYSeR-MJG9Gtlw-MBveOf8Dyi3tfkP_mv-BJDCnCQ</recordid><startdate>20200401</startdate><enddate>20200401</enddate><creator>Matsumori, Hiroaki</creator><creator>Shimizu, Toshihisa</creator><creator>Kosaka, Takashi</creator><creator>Matsui, Nobuyuki</creator><general>American Institute of Physics</general><general>AIP Publishing LLC</general><scope>AJDQP</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>8FD</scope><scope>H8D</scope><scope>L7M</scope><scope>DOA</scope></search><sort><creationdate>20200401</creationdate><title>Core loss calculation for power electronics converter excitation from a sinusoidal excited core loss data</title><author>Matsumori, Hiroaki ; Shimizu, Toshihisa ; Kosaka, Takashi ; Matsui, Nobuyuki</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c494t-9e6ba08da08f3533363a930b7cc82a8cf408ac02c58b36351d905d6e432fe3103</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2020</creationdate><topic>Bias</topic><topic>Converters</topic><topic>Core loss</topic><topic>Electric potential</topic><topic>Electronics</topic><topic>Excitation</topic><topic>Mathematical analysis</topic><topic>Voltage</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Matsumori, Hiroaki</creatorcontrib><creatorcontrib>Shimizu, Toshihisa</creatorcontrib><creatorcontrib>Kosaka, Takashi</creatorcontrib><creatorcontrib>Matsui, Nobuyuki</creatorcontrib><collection>AIP Open Access Journals</collection><collection>CrossRef</collection><collection>Technology Research Database</collection><collection>Aerospace Database</collection><collection>Advanced Technologies Database with Aerospace</collection><collection>Open Access: DOAJ - Directory of Open Access Journals</collection><jtitle>AIP advances</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Matsumori, Hiroaki</au><au>Shimizu, Toshihisa</au><au>Kosaka, Takashi</au><au>Matsui, Nobuyuki</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Core loss calculation for power electronics converter excitation from a sinusoidal excited core loss data</atitle><jtitle>AIP advances</jtitle><date>2020-04-01</date><risdate>2020</risdate><volume>10</volume><issue>4</issue><spage>045001</spage><epage>045001-4</epage><pages>045001-045001-4</pages><issn>2158-3226</issn><eissn>2158-3226</eissn><coden>AAIDBI</coden><abstract>The authors propose a core loss calculation method for power electronics converter excitation from sinusoidal excited core loss data. This method is based on Brockmeyer’s theory and adapts to calculate core loss under DC-bias excitation conditions. Furthermore, the number of core loss test conditions are reduced as this method only requires the addition of DC-bias characteristics to the sinusoidal excitation core loss data provided by the core manufacturers. To validate the proposed method, the core losses under sinusoidal and square voltage excitations are first measured by a BH analyzer with a DC-bias excitation unit. Then, the measured values under a square voltage excitation and the calculated values from a sinusoidal excited core loss data are compared.</abstract><cop>Melville</cop><pub>American Institute of Physics</pub><doi>10.1063/1.5129419</doi><tpages>4</tpages><oa>free_for_read</oa></addata></record> |
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subjects | Bias Converters Core loss Electric potential Electronics Excitation Mathematical analysis Voltage |
title | Core loss calculation for power electronics converter excitation from a sinusoidal excited core loss data |
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