Structural and optical properties of Tm3+-doped 80SiO2-10ZrO2-10Al2O3 thin films with different thickness

The synthesis of rare-earth (RE)-based silica glass is currently a key challenge for the development of integrated optics devices such as lasers and optical amplifiers. In this work, Tm3+-doped 80SiO2−10ZrO2−10Al2O3 thin films were prepared by sol-gel and dip-coating methods. The structural and opti...

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Bibliographic Details
Main Authors: Kamil, S. A., Kamal, S. N. A. M., Supardan, S. N.
Format: Conference Proceeding
Language:English
Subjects:
Dip coatings
Fourier transforms
Immersion coating
Infrared analysis
Integrated optics
Optical properties
Rare earth elements
Refractivity
Silica glass
Silicon dioxide
Sol-gel processes
Thickness
Thin films
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Summary:The synthesis of rare-earth (RE)-based silica glass is currently a key challenge for the development of integrated optics devices such as lasers and optical amplifiers. In this work, Tm3+-doped 80SiO2−10ZrO2−10Al2O3 thin films were prepared by sol-gel and dip-coating methods. The structural and optical properties of thin films with different number of coating layers: 15, 20, 25 and 30 layers were investigated. It can be observed from X-ray diffraction (XRD) results that the thin films showed an amorphous characteristic with some crystalline peaks for samples with 20 and 25 layers. From Fourier transform infrared (FTIR) spectroscopy analysis observed that the presence of hydroxyl (OH) absorption and its vibrational (phonon) energy at the band of 3100 cm−1 to 3470 cm−1 which can reduce luminescence characteristic, and significantly affect the optical device performance. The refractive index increases with increasing number of coating layers due to the increase in density, whereas the thickness of the samples become less as the coating layers become denser.
ISSN:0094-243X
1551-7616
DOI:10.1063/5.0058362