Loading…
Raman tensor determination of transparent uniaxial crystals and their thin films—a-plane GaN as exemplary case
The classical Raman tensor approach does not work for optically anisotropic materials in general. For the transparency regime, this can be circumvented by using an effective Raman tensor that considers the material's birefringence. In the specific case of an uniaxial crystal with in-plane orien...
Saved in:
Published in: | Applied physics letters 2021-09, Vol.119 (12), p.121109 |
---|---|
Main Authors: | , , , , |
Format: | Article |
Language: | English |
Subjects: | |
Citations: | Items that this one cites Items that cite this one |
Online Access: | Get full text |
Tags: |
Add Tag
No Tags, Be the first to tag this record!
|
cited_by | cdi_FETCH-LOGICAL-c327t-b89bbe6fe4bb71af48451e8f7be5f1f1a47e0cab081fe913875aadfea2ea99a73 |
---|---|
cites | cdi_FETCH-LOGICAL-c327t-b89bbe6fe4bb71af48451e8f7be5f1f1a47e0cab081fe913875aadfea2ea99a73 |
container_end_page | |
container_issue | 12 |
container_start_page | 121109 |
container_title | Applied physics letters |
container_volume | 119 |
creator | Hildebrandt, R. Sturm, C. Wieneke, M. Dadgar, A. Grundmann, M. |
description | The classical Raman tensor approach does not work for optically anisotropic materials in general. For the transparency regime, this can be circumvented by using an effective Raman tensor that considers the material's birefringence. In the specific case of an uniaxial crystal with in-plane orientation of principal axis, this effective Raman tensor is similar to the classical one, except for an additional phase factor for each tensor element. This phase is dependent on the sample thickness, which is demonstrated here experimentally via polarization resolved Raman scattering of a-plane GaN thin films. The experimental observations coincide very well with our model predictions. |
doi_str_mv | 10.1063/5.0060198 |
format | article |
fullrecord | <record><control><sourceid>proquest_scita</sourceid><recordid>TN_cdi_scitation_primary_10_1063_5_0060198</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>2575616302</sourcerecordid><originalsourceid>FETCH-LOGICAL-c327t-b89bbe6fe4bb71af48451e8f7be5f1f1a47e0cab081fe913875aadfea2ea99a73</originalsourceid><addsrcrecordid>eNqdkM1KxDAQgIMouP4cfIOAJ4WuSdM07VEWXYVFQfRcpu0Es7RpTbKye_MhfEKfxOguePcywwzf_PARcsbZlLNcXMkpYznjZbFHJpwplQjOi30yYYyJJC8lPyRH3i9jKVMhJmR8gh4sDWj94GiLAV1vLAQzWDpoGhxYP4JDG-jKGlgb6GjjNj5A5ynYloZXNC5GY6k2Xe-_Pj4hGTuwSOfwQMFTXGMfG25DG_B4Qg50nMXTXT4mL7c3z7O7ZPE4v59dL5JGpCokdVHWNeYas7pWHHRWZJJjoVWNUnPNIVPIGqhZwTWWXBRKArQaIUUoS1DimJxv945ueFuhD9VyWDkbT1apVDLnuWBppC62VOMG7x3qanSmj79WnFU_QitZ7YRG9nLL-saEX0P_g98H9wdWY6vFN75ph4Q</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>2575616302</pqid></control><display><type>article</type><title>Raman tensor determination of transparent uniaxial crystals and their thin films—a-plane GaN as exemplary case</title><source>American Institute of Physics:Jisc Collections:Transitional Journals Agreement 2021-23 (Reading list)</source><source>AIP - American Institute of Physics</source><creator>Hildebrandt, R. ; Sturm, C. ; Wieneke, M. ; Dadgar, A. ; Grundmann, M.</creator><creatorcontrib>Hildebrandt, R. ; Sturm, C. ; Wieneke, M. ; Dadgar, A. ; Grundmann, M.</creatorcontrib><description>The classical Raman tensor approach does not work for optically anisotropic materials in general. For the transparency regime, this can be circumvented by using an effective Raman tensor that considers the material's birefringence. In the specific case of an uniaxial crystal with in-plane orientation of principal axis, this effective Raman tensor is similar to the classical one, except for an additional phase factor for each tensor element. This phase is dependent on the sample thickness, which is demonstrated here experimentally via polarization resolved Raman scattering of a-plane GaN thin films. The experimental observations coincide very well with our model predictions.</description><identifier>ISSN: 0003-6951</identifier><identifier>EISSN: 1077-3118</identifier><identifier>DOI: 10.1063/5.0060198</identifier><identifier>CODEN: APPLAB</identifier><language>eng</language><publisher>Melville: American Institute of Physics</publisher><subject>Applied physics ; Birefringence ; Crystal optics ; Crystal structure ; Mathematical analysis ; Raman spectra ; Tensors ; Thin films</subject><ispartof>Applied physics letters, 2021-09, Vol.119 (12), p.121109</ispartof><rights>Author(s)</rights><rights>2021 Author(s). Published under an exclusive license by AIP Publishing.</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c327t-b89bbe6fe4bb71af48451e8f7be5f1f1a47e0cab081fe913875aadfea2ea99a73</citedby><cites>FETCH-LOGICAL-c327t-b89bbe6fe4bb71af48451e8f7be5f1f1a47e0cab081fe913875aadfea2ea99a73</cites><orcidid>0000-0001-8664-236X ; 0000-0002-2950-5681 ; 0000-0001-6932-604X ; 0000-0001-7554-182X ; 0000-0002-4174-1169</orcidid></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://pubs.aip.org/apl/article-lookup/doi/10.1063/5.0060198$$EHTML$$P50$$Gscitation$$H</linktohtml><link.rule.ids>314,780,782,784,795,27923,27924,76154</link.rule.ids></links><search><creatorcontrib>Hildebrandt, R.</creatorcontrib><creatorcontrib>Sturm, C.</creatorcontrib><creatorcontrib>Wieneke, M.</creatorcontrib><creatorcontrib>Dadgar, A.</creatorcontrib><creatorcontrib>Grundmann, M.</creatorcontrib><title>Raman tensor determination of transparent uniaxial crystals and their thin films—a-plane GaN as exemplary case</title><title>Applied physics letters</title><description>The classical Raman tensor approach does not work for optically anisotropic materials in general. For the transparency regime, this can be circumvented by using an effective Raman tensor that considers the material's birefringence. In the specific case of an uniaxial crystal with in-plane orientation of principal axis, this effective Raman tensor is similar to the classical one, except for an additional phase factor for each tensor element. This phase is dependent on the sample thickness, which is demonstrated here experimentally via polarization resolved Raman scattering of a-plane GaN thin films. The experimental observations coincide very well with our model predictions.</description><subject>Applied physics</subject><subject>Birefringence</subject><subject>Crystal optics</subject><subject>Crystal structure</subject><subject>Mathematical analysis</subject><subject>Raman spectra</subject><subject>Tensors</subject><subject>Thin films</subject><issn>0003-6951</issn><issn>1077-3118</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2021</creationdate><recordtype>article</recordtype><recordid>eNqdkM1KxDAQgIMouP4cfIOAJ4WuSdM07VEWXYVFQfRcpu0Es7RpTbKye_MhfEKfxOguePcywwzf_PARcsbZlLNcXMkpYznjZbFHJpwplQjOi30yYYyJJC8lPyRH3i9jKVMhJmR8gh4sDWj94GiLAV1vLAQzWDpoGhxYP4JDG-jKGlgb6GjjNj5A5ynYloZXNC5GY6k2Xe-_Pj4hGTuwSOfwQMFTXGMfG25DG_B4Qg50nMXTXT4mL7c3z7O7ZPE4v59dL5JGpCokdVHWNeYas7pWHHRWZJJjoVWNUnPNIVPIGqhZwTWWXBRKArQaIUUoS1DimJxv945ueFuhD9VyWDkbT1apVDLnuWBppC62VOMG7x3qanSmj79WnFU_QitZ7YRG9nLL-saEX0P_g98H9wdWY6vFN75ph4Q</recordid><startdate>20210920</startdate><enddate>20210920</enddate><creator>Hildebrandt, R.</creator><creator>Sturm, C.</creator><creator>Wieneke, M.</creator><creator>Dadgar, A.</creator><creator>Grundmann, M.</creator><general>American Institute of Physics</general><scope>AAYXX</scope><scope>CITATION</scope><scope>8FD</scope><scope>H8D</scope><scope>L7M</scope><orcidid>https://orcid.org/0000-0001-8664-236X</orcidid><orcidid>https://orcid.org/0000-0002-2950-5681</orcidid><orcidid>https://orcid.org/0000-0001-6932-604X</orcidid><orcidid>https://orcid.org/0000-0001-7554-182X</orcidid><orcidid>https://orcid.org/0000-0002-4174-1169</orcidid></search><sort><creationdate>20210920</creationdate><title>Raman tensor determination of transparent uniaxial crystals and their thin films—a-plane GaN as exemplary case</title><author>Hildebrandt, R. ; Sturm, C. ; Wieneke, M. ; Dadgar, A. ; Grundmann, M.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c327t-b89bbe6fe4bb71af48451e8f7be5f1f1a47e0cab081fe913875aadfea2ea99a73</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2021</creationdate><topic>Applied physics</topic><topic>Birefringence</topic><topic>Crystal optics</topic><topic>Crystal structure</topic><topic>Mathematical analysis</topic><topic>Raman spectra</topic><topic>Tensors</topic><topic>Thin films</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Hildebrandt, R.</creatorcontrib><creatorcontrib>Sturm, C.</creatorcontrib><creatorcontrib>Wieneke, M.</creatorcontrib><creatorcontrib>Dadgar, A.</creatorcontrib><creatorcontrib>Grundmann, M.</creatorcontrib><collection>CrossRef</collection><collection>Technology Research Database</collection><collection>Aerospace Database</collection><collection>Advanced Technologies Database with Aerospace</collection><jtitle>Applied physics letters</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Hildebrandt, R.</au><au>Sturm, C.</au><au>Wieneke, M.</au><au>Dadgar, A.</au><au>Grundmann, M.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Raman tensor determination of transparent uniaxial crystals and their thin films—a-plane GaN as exemplary case</atitle><jtitle>Applied physics letters</jtitle><date>2021-09-20</date><risdate>2021</risdate><volume>119</volume><issue>12</issue><spage>121109</spage><pages>121109-</pages><issn>0003-6951</issn><eissn>1077-3118</eissn><coden>APPLAB</coden><abstract>The classical Raman tensor approach does not work for optically anisotropic materials in general. For the transparency regime, this can be circumvented by using an effective Raman tensor that considers the material's birefringence. In the specific case of an uniaxial crystal with in-plane orientation of principal axis, this effective Raman tensor is similar to the classical one, except for an additional phase factor for each tensor element. This phase is dependent on the sample thickness, which is demonstrated here experimentally via polarization resolved Raman scattering of a-plane GaN thin films. The experimental observations coincide very well with our model predictions.</abstract><cop>Melville</cop><pub>American Institute of Physics</pub><doi>10.1063/5.0060198</doi><tpages>5</tpages><orcidid>https://orcid.org/0000-0001-8664-236X</orcidid><orcidid>https://orcid.org/0000-0002-2950-5681</orcidid><orcidid>https://orcid.org/0000-0001-6932-604X</orcidid><orcidid>https://orcid.org/0000-0001-7554-182X</orcidid><orcidid>https://orcid.org/0000-0002-4174-1169</orcidid></addata></record> |
fulltext | fulltext |
identifier | ISSN: 0003-6951 |
ispartof | Applied physics letters, 2021-09, Vol.119 (12), p.121109 |
issn | 0003-6951 1077-3118 |
language | eng |
recordid | cdi_scitation_primary_10_1063_5_0060198 |
source | American Institute of Physics:Jisc Collections:Transitional Journals Agreement 2021-23 (Reading list); AIP - American Institute of Physics |
subjects | Applied physics Birefringence Crystal optics Crystal structure Mathematical analysis Raman spectra Tensors Thin films |
title | Raman tensor determination of transparent uniaxial crystals and their thin films—a-plane GaN as exemplary case |
url | http://sfxeu10.hosted.exlibrisgroup.com/loughborough?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-12T08%3A12%3A47IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest_scita&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Raman%20tensor%20determination%20of%20transparent%20uniaxial%20crystals%20and%20their%20thin%20films%E2%80%94a-plane%20GaN%20as%20exemplary%20case&rft.jtitle=Applied%20physics%20letters&rft.au=Hildebrandt,%20R.&rft.date=2021-09-20&rft.volume=119&rft.issue=12&rft.spage=121109&rft.pages=121109-&rft.issn=0003-6951&rft.eissn=1077-3118&rft.coden=APPLAB&rft_id=info:doi/10.1063/5.0060198&rft_dat=%3Cproquest_scita%3E2575616302%3C/proquest_scita%3E%3Cgrp_id%3Ecdi_FETCH-LOGICAL-c327t-b89bbe6fe4bb71af48451e8f7be5f1f1a47e0cab081fe913875aadfea2ea99a73%3C/grp_id%3E%3Coa%3E%3C/oa%3E%3Curl%3E%3C/url%3E&rft_id=info:oai/&rft_pqid=2575616302&rft_id=info:pmid/&rfr_iscdi=true |