Electron optical system with integrated PCM for sheet electron beam devices

There is an increasing interest for the high-power, high-frequency electromagnetic wave generation by the sheet electron beam (SEB) vacuum devices, and in which, the transport of the SEB conducted by periodic cusped magnetic (PCM) is a key issue. While the PCM will meet serious challenges especially...

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Bibliographic Details
Published in:Physics of plasmas 2021-12, Vol.28 (12)
Main Authors: Yin, PengCheng, Xu, Jin, Fang, ShuanZhu, Yang, RuiChao, Luo, JinJing, Zhang, Jian, Jia, DongDong, Yin, HaiRong, Yue, LingNa, Zhao, GuoQing, Guo, Guo, Xu, Lin, Wang, WenXiang, Wei, YanYu
Format: Article
Language:English
Subjects:
Electromagnetic radiation
Electron beams
Electron guns
Kinetic energy
Magnetic fields
Plasma physics
Stability analysis
Traveling wave tubes
Traveling waves
Wave generation
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Summary:There is an increasing interest for the high-power, high-frequency electromagnetic wave generation by the sheet electron beam (SEB) vacuum devices, and in which, the transport of the SEB conducted by periodic cusped magnetic (PCM) is a key issue. While the PCM will meet serious challenges especially in the case of high current density and low kinetic energy of electrons, the analysis indicates that the easy breaking of the stability of SEB focused by PCM may be caused by a tiny deviation of the transverse magnetic field from the theoretical value. To guarantee stable long-distance transportation of SEB, a method for focusing SEB by integrated PCM (IPCM) in which all pole pieces are combined into a whole is proposed for ensuring high accuracy of magnetic field distribution, together with the decrease in the leaking magnetic field in the electron gun region. To verify the effect of IPCM, the simulation and experiment work of an electron optical system are carried out for the same W band traveling wave tube by conventional PCM and IPCM, respectively. The experimental results depict that the IPCM can greatly improve the electron transmission rate.
ISSN:1070-664X
1089-7674
DOI:10.1063/5.0076651