Non-contact base excited AFM: Modeling and simulation

AFM atomic force microscopes are recognized as one of the main identification equipment in nanoscale. This microscope, with the use of the needle (Probe), is very sharp, which is the ideal case in which only one atom of the place of language. properties of the samples about the analysis for non-dire...

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Bibliographic Details
Main Authors: Bahrami, Mohammad Reza, Abbaszade, Amir
Format: Conference Proceeding
Language:English
Subjects:
Astronautics
Dynamic response
Frequency response
Microscopes
Van der Waals forces
Online Access:Get full text
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Summary:AFM atomic force microscopes are recognized as one of the main identification equipment in nanoscale. This microscope, with the use of the needle (Probe), is very sharp, which is the ideal case in which only one atom of the place of language. properties of the samples about the analysis for non-direct offers, and plays an important role in the progress of research in various sciences, including nanotechnologies, electronics, energy, etc., Astronautics, and so on is played. When it is necessary to create the topography of a surface with a resolution of tens of angstroms up to atomic, AFM is a powerful tool to use. This article studies the non-contact AFM while its tip is excited by dual external harmonic forces. The Van der Waals force is considered as the tip-sample interaction force, which makes the system non-linear. To study the effects of amplitudes of excitations on the dynamic response, the frequency response equations have been used which are obtained by the Van der Pol average method.
ISSN:0094-243X
1551-7616
DOI:10.1063/5.0105778