The influence of thermal cycling on the activation energy of conduction electrons and filament temperature in Pt/NiOx/Pt ReRAMs

We investigate the electrical and thermal conduction properties of low- (ON) and high-resistance (OFF) states in Pt/NiOx/Pt based unipolar ReRAM devices during cooling and warming cycles between 300 and 180 K. The conduction electron-trap activation energy was found to decrease upon warming. Althoug...

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Bibliographic Details
Published in:Applied physics letters 2023-06, Vol.122 (25)
Main Authors: Alagoz, H. S., Egilmez, M., Jung, J., Chow, K. H.
Format: Article
Language:English
Subjects:
Activation energy
Ambient temperature
Applied physics
Conduction electrons
Conduction heating
Filaments
High temperature
Thermal cycling
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Summary:We investigate the electrical and thermal conduction properties of low- (ON) and high-resistance (OFF) states in Pt/NiOx/Pt based unipolar ReRAM devices during cooling and warming cycles between 300 and 180 K. The conduction electron-trap activation energy was found to decrease upon warming. Although thermal cycling did not significantly affect the average resistance-temperature coefficient of the Pt diffused conductive filaments in the system, the ON-state resistance fluctuations increase at high temperatures, indicating that ambient temperature significantly affects the sizes of the formed filaments. The mechanism behind these thermally activated changes is discussed.
ISSN:0003-6951
1077-3118
DOI:10.1063/5.0151967