Scanning probe metrology in the presence of surface charge

Surface charge on insulating samples can be a significant source of error for scanning probe microscopes. We have found that it is possible to operate a scanning force microscope in a manner that makes it relatively immune to charge-induced forces while still allowing the probe tip to nondestructive...

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Published in:Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures 2000-11, Vol.18 (6), p.3264-3267
Main Authors: Griffith, J. E., Kneedler, E. M., Ningen, S., Berghaus, A., Bryson, C. E., Pau, S., Houge, E., Shofner, T.
Format: Article
Language:English
Subjects:
Atomic force microscopy
Electric charge
Force measurement
Measurement errors
Nondestructive examination
Probes
Sensors
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container_title Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures
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creator Griffith, J. E.
Kneedler, E. M.
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Shofner, T.
description Surface charge on insulating samples can be a significant source of error for scanning probe microscopes. We have found that it is possible to operate a scanning force microscope in a manner that makes it relatively immune to charge-induced forces while still allowing the probe tip to nondestructively follow the surface topography. The need to maintain close charge balance on the sample is thus obviated. We have used this strategy to perform critical dimension measurements on optical photomasks with the Surface/Interface Stylus NanoProfilometer. This instrument incorporates a servoed force-balance sensor. Surface topography is determined by touching the surface with contact forces between 0.1 and 1 μN.
doi_str_mv 10.1116/1.1313586
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source American Institute of Physics:Jisc Collections:Transitional Journals Agreement 2021-23 (Reading list)
subjects Atomic force microscopy
Electric charge
Force measurement
Measurement errors
Nondestructive examination
Probes
Sensors
title Scanning probe metrology in the presence of surface charge
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