Loading…

Solid-solid dewetting of scandium thin films on the W(100) surface observed using emission microscopy

Several operating modes of cathode lens emission microscopy are used to observe scandium on W(100), including mirror microscopy, thermionic emission microscopy, and low energy electron diffraction. Scandium thin films are deposited by thermal evaporation from a metal source onto W(100). The scandium...

Full description

Saved in:
Bibliographic Details
Published in:Journal of vacuum science and technology. B, Nanotechnology & microelectronics Nanotechnology & microelectronics, 2019-01, Vol.37 (1)
Main Authors: Mroz, Michael V., Savina, Tatiana, Kordesch, Martin E., Sadowski, Jerzy T., Tenney, Samuel A.
Format: Article
Language:English
Subjects:
Citations: Items that this one cites
Items that cite this one
Online Access:Get full text
Tags: Add Tag
No Tags, Be the first to tag this record!
cited_by cdi_FETCH-LOGICAL-c361t-3e86a9f2d73ab98af881a21d534cfdea84626838815e93724a30f6d9b9a81cf13
cites cdi_FETCH-LOGICAL-c361t-3e86a9f2d73ab98af881a21d534cfdea84626838815e93724a30f6d9b9a81cf13
container_end_page
container_issue 1
container_start_page
container_title Journal of vacuum science and technology. B, Nanotechnology & microelectronics
container_volume 37
creator Mroz, Michael V.
Savina, Tatiana
Kordesch, Martin E.
Sadowski, Jerzy T.
Tenney, Samuel A.
description Several operating modes of cathode lens emission microscopy are used to observe scandium on W(100), including mirror microscopy, thermionic emission microscopy, and low energy electron diffraction. Scandium thin films are deposited by thermal evaporation from a metal source onto W(100). The scandium films on W(100) are observed to dewet from the W(100) surface and to form droplets when the surface is heated: the dewetting temperature is thickness dependent and spans a range from 500 to 900 °C, which is far below the melting temperature (1541 °C). Thinner films produce smaller droplets; a range of film thicknesses from 5 to 30 nm was tested. X-ray photoelectron spectroscopy of the scandium films exposed to oxygen was also measured in order to understand the function of scandium in thermionic cathodes. The shift of the W 4f peaks upon oxygen absorption, scandium adsorption, and subsequent heating indicates that oxygen preferentially bonds to scandium. The shift in the scandium 3p level indicates formation of Sc2O3.
doi_str_mv 10.1116/1.5066015
format article
fullrecord <record><control><sourceid>scitation_osti_</sourceid><recordid>TN_cdi_scitation_primary_10_1116_1_5066015</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>scitation_primary_10_1116_1_5066015</sourcerecordid><originalsourceid>FETCH-LOGICAL-c361t-3e86a9f2d73ab98af881a21d534cfdea84626838815e93724a30f6d9b9a81cf13</originalsourceid><addsrcrecordid>eNqdkEtLAzEQgIMoWLQH_0HwZIWtmc1umj1K8QUFDyoeQ5qHjXQ3ZSdV-u_N0qJ3B-bJN8PMEHIBbAoA4gamNROCQX1ERiUIUZSzujr-jStxSsaInyyLkDXjbETcS1wHW-BgqXXfLqXQfdDoKRrd2bBtaVqFjvqwbpHGLmeOvl8BYxOK295r42hcouu_nKVbHHpdGxBDRttg-ogmbnbn5MTrNbrxwZ-Rt_u71_ljsXh-eJrfLgrDBaSCOyl040s743rZSO2lBF2CrXllvHVaVqIUkudq7Ro-KyvNmRe2WTZagvHAz8jlfm7EFBSakJxZmdh1ziQFVQNZMzTZQ8N22DuvNn1odb9TwNTwRwXq8MfMXu_ZYZZO-ar_wV-x_wPVxnr-AwyegH8</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype></control><display><type>article</type><title>Solid-solid dewetting of scandium thin films on the W(100) surface observed using emission microscopy</title><source>American Institute of Physics:Jisc Collections:Transitional Journals Agreement 2021-23 (Reading list)</source><creator>Mroz, Michael V. ; Savina, Tatiana ; Kordesch, Martin E. ; Sadowski, Jerzy T. ; Tenney, Samuel A.</creator><creatorcontrib>Mroz, Michael V. ; Savina, Tatiana ; Kordesch, Martin E. ; Sadowski, Jerzy T. ; Tenney, Samuel A. ; Brookhaven National Lab. (BNL), Upton, NY (United States)</creatorcontrib><description>Several operating modes of cathode lens emission microscopy are used to observe scandium on W(100), including mirror microscopy, thermionic emission microscopy, and low energy electron diffraction. Scandium thin films are deposited by thermal evaporation from a metal source onto W(100). The scandium films on W(100) are observed to dewet from the W(100) surface and to form droplets when the surface is heated: the dewetting temperature is thickness dependent and spans a range from 500 to 900 °C, which is far below the melting temperature (1541 °C). Thinner films produce smaller droplets; a range of film thicknesses from 5 to 30 nm was tested. X-ray photoelectron spectroscopy of the scandium films exposed to oxygen was also measured in order to understand the function of scandium in thermionic cathodes. The shift of the W 4f peaks upon oxygen absorption, scandium adsorption, and subsequent heating indicates that oxygen preferentially bonds to scandium. The shift in the scandium 3p level indicates formation of Sc2O3.</description><identifier>ISSN: 2166-2746</identifier><identifier>EISSN: 2166-2754</identifier><identifier>DOI: 10.1116/1.5066015</identifier><identifier>CODEN: JVTBD9</identifier><language>eng</language><publisher>United States: American Vacuum Society/AIP</publisher><subject>MATERIALS SCIENCE</subject><ispartof>Journal of vacuum science and technology. B, Nanotechnology &amp; microelectronics, 2019-01, Vol.37 (1)</ispartof><rights>Author(s)</rights><lds50>peer_reviewed</lds50><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c361t-3e86a9f2d73ab98af881a21d534cfdea84626838815e93724a30f6d9b9a81cf13</citedby><cites>FETCH-LOGICAL-c361t-3e86a9f2d73ab98af881a21d534cfdea84626838815e93724a30f6d9b9a81cf13</cites><orcidid>0000-0002-4365-7796 ; 0000000243657796</orcidid></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><link.rule.ids>230,314,780,784,885,27923,27924</link.rule.ids><backlink>$$Uhttps://www.osti.gov/servlets/purl/1491149$$D View this record in Osti.gov$$Hfree_for_read</backlink></links><search><creatorcontrib>Mroz, Michael V.</creatorcontrib><creatorcontrib>Savina, Tatiana</creatorcontrib><creatorcontrib>Kordesch, Martin E.</creatorcontrib><creatorcontrib>Sadowski, Jerzy T.</creatorcontrib><creatorcontrib>Tenney, Samuel A.</creatorcontrib><creatorcontrib>Brookhaven National Lab. (BNL), Upton, NY (United States)</creatorcontrib><title>Solid-solid dewetting of scandium thin films on the W(100) surface observed using emission microscopy</title><title>Journal of vacuum science and technology. B, Nanotechnology &amp; microelectronics</title><description>Several operating modes of cathode lens emission microscopy are used to observe scandium on W(100), including mirror microscopy, thermionic emission microscopy, and low energy electron diffraction. Scandium thin films are deposited by thermal evaporation from a metal source onto W(100). The scandium films on W(100) are observed to dewet from the W(100) surface and to form droplets when the surface is heated: the dewetting temperature is thickness dependent and spans a range from 500 to 900 °C, which is far below the melting temperature (1541 °C). Thinner films produce smaller droplets; a range of film thicknesses from 5 to 30 nm was tested. X-ray photoelectron spectroscopy of the scandium films exposed to oxygen was also measured in order to understand the function of scandium in thermionic cathodes. The shift of the W 4f peaks upon oxygen absorption, scandium adsorption, and subsequent heating indicates that oxygen preferentially bonds to scandium. The shift in the scandium 3p level indicates formation of Sc2O3.</description><subject>MATERIALS SCIENCE</subject><issn>2166-2746</issn><issn>2166-2754</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2019</creationdate><recordtype>article</recordtype><recordid>eNqdkEtLAzEQgIMoWLQH_0HwZIWtmc1umj1K8QUFDyoeQ5qHjXQ3ZSdV-u_N0qJ3B-bJN8PMEHIBbAoA4gamNROCQX1ERiUIUZSzujr-jStxSsaInyyLkDXjbETcS1wHW-BgqXXfLqXQfdDoKRrd2bBtaVqFjvqwbpHGLmeOvl8BYxOK295r42hcouu_nKVbHHpdGxBDRttg-ogmbnbn5MTrNbrxwZ-Rt_u71_ljsXh-eJrfLgrDBaSCOyl040s743rZSO2lBF2CrXllvHVaVqIUkudq7Ro-KyvNmRe2WTZagvHAz8jlfm7EFBSakJxZmdh1ziQFVQNZMzTZQ8N22DuvNn1odb9TwNTwRwXq8MfMXu_ZYZZO-ar_wV-x_wPVxnr-AwyegH8</recordid><startdate>20190101</startdate><enddate>20190101</enddate><creator>Mroz, Michael V.</creator><creator>Savina, Tatiana</creator><creator>Kordesch, Martin E.</creator><creator>Sadowski, Jerzy T.</creator><creator>Tenney, Samuel A.</creator><general>American Vacuum Society/AIP</general><scope>AAYXX</scope><scope>CITATION</scope><scope>OIOZB</scope><scope>OTOTI</scope><orcidid>https://orcid.org/0000-0002-4365-7796</orcidid><orcidid>https://orcid.org/0000000243657796</orcidid></search><sort><creationdate>20190101</creationdate><title>Solid-solid dewetting of scandium thin films on the W(100) surface observed using emission microscopy</title><author>Mroz, Michael V. ; Savina, Tatiana ; Kordesch, Martin E. ; Sadowski, Jerzy T. ; Tenney, Samuel A.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c361t-3e86a9f2d73ab98af881a21d534cfdea84626838815e93724a30f6d9b9a81cf13</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2019</creationdate><topic>MATERIALS SCIENCE</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Mroz, Michael V.</creatorcontrib><creatorcontrib>Savina, Tatiana</creatorcontrib><creatorcontrib>Kordesch, Martin E.</creatorcontrib><creatorcontrib>Sadowski, Jerzy T.</creatorcontrib><creatorcontrib>Tenney, Samuel A.</creatorcontrib><creatorcontrib>Brookhaven National Lab. (BNL), Upton, NY (United States)</creatorcontrib><collection>CrossRef</collection><collection>OSTI.GOV - Hybrid</collection><collection>OSTI.GOV</collection><jtitle>Journal of vacuum science and technology. B, Nanotechnology &amp; microelectronics</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Mroz, Michael V.</au><au>Savina, Tatiana</au><au>Kordesch, Martin E.</au><au>Sadowski, Jerzy T.</au><au>Tenney, Samuel A.</au><aucorp>Brookhaven National Lab. (BNL), Upton, NY (United States)</aucorp><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Solid-solid dewetting of scandium thin films on the W(100) surface observed using emission microscopy</atitle><jtitle>Journal of vacuum science and technology. B, Nanotechnology &amp; microelectronics</jtitle><date>2019-01-01</date><risdate>2019</risdate><volume>37</volume><issue>1</issue><issn>2166-2746</issn><eissn>2166-2754</eissn><coden>JVTBD9</coden><abstract>Several operating modes of cathode lens emission microscopy are used to observe scandium on W(100), including mirror microscopy, thermionic emission microscopy, and low energy electron diffraction. Scandium thin films are deposited by thermal evaporation from a metal source onto W(100). The scandium films on W(100) are observed to dewet from the W(100) surface and to form droplets when the surface is heated: the dewetting temperature is thickness dependent and spans a range from 500 to 900 °C, which is far below the melting temperature (1541 °C). Thinner films produce smaller droplets; a range of film thicknesses from 5 to 30 nm was tested. X-ray photoelectron spectroscopy of the scandium films exposed to oxygen was also measured in order to understand the function of scandium in thermionic cathodes. The shift of the W 4f peaks upon oxygen absorption, scandium adsorption, and subsequent heating indicates that oxygen preferentially bonds to scandium. The shift in the scandium 3p level indicates formation of Sc2O3.</abstract><cop>United States</cop><pub>American Vacuum Society/AIP</pub><doi>10.1116/1.5066015</doi><tpages>6</tpages><orcidid>https://orcid.org/0000-0002-4365-7796</orcidid><orcidid>https://orcid.org/0000000243657796</orcidid><oa>free_for_read</oa></addata></record>
fulltext fulltext
identifier ISSN: 2166-2746
ispartof Journal of vacuum science and technology. B, Nanotechnology & microelectronics, 2019-01, Vol.37 (1)
issn 2166-2746
2166-2754
language eng
recordid cdi_scitation_primary_10_1116_1_5066015
source American Institute of Physics:Jisc Collections:Transitional Journals Agreement 2021-23 (Reading list)
subjects MATERIALS SCIENCE
title Solid-solid dewetting of scandium thin films on the W(100) surface observed using emission microscopy
url http://sfxeu10.hosted.exlibrisgroup.com/loughborough?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-09T08%3A53%3A07IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-scitation_osti_&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Solid-solid%20dewetting%20of%20scandium%20thin%20films%20on%20the%20W(100)%20surface%20observed%20using%20emission%20microscopy&rft.jtitle=Journal%20of%20vacuum%20science%20and%20technology.%20B,%20Nanotechnology%20&%20microelectronics&rft.au=Mroz,%20Michael%20V.&rft.aucorp=Brookhaven%20National%20Lab.%20(BNL),%20Upton,%20NY%20(United%20States)&rft.date=2019-01-01&rft.volume=37&rft.issue=1&rft.issn=2166-2746&rft.eissn=2166-2754&rft.coden=JVTBD9&rft_id=info:doi/10.1116/1.5066015&rft_dat=%3Cscitation_osti_%3Escitation_primary_10_1116_1_5066015%3C/scitation_osti_%3E%3Cgrp_id%3Ecdi_FETCH-LOGICAL-c361t-3e86a9f2d73ab98af881a21d534cfdea84626838815e93724a30f6d9b9a81cf13%3C/grp_id%3E%3Coa%3E%3C/oa%3E%3Curl%3E%3C/url%3E&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true