SEM and TEM Image Analysis for Morphology and Phase Transition of CZTS, Sb2Se3 and Perovskite Thin Films under Thermal Stress: SEM and TEM Image Analysis for Morphology

This study utilizes an image processing method to analyse the grain size of perovskite, CZTS kesterite and antimony chalcogenide (Sb 2 Se 3 ) thin films at various temperatures using SEM and TEM images. Empirical equations (exponential, Gaussian, power law) were derived from the data, revealing dist...

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Bibliographic Details
Published in:Journal of electronic materials 2025, Vol.54 (1), p.523-530
Main Authors: Hajjiah, Ali, Gorji, Nima E.
Format: Article
Language:English
Subjects:
Characterization and Evaluation of Materials
Chemistry and Materials Science
Electronics and Microelectronics
Energy Materials
Energy Storage
Instrumentation
Materials Science
Optical and Electronic Materials
Original Research Article
Solid State Physics
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Summary:This study utilizes an image processing method to analyse the grain size of perovskite, CZTS kesterite and antimony chalcogenide (Sb 2 Se 3 ) thin films at various temperatures using SEM and TEM images. Empirical equations (exponential, Gaussian, power law) were derived from the data, revealing distinct temperature-dependent trends in grain size. Perovskite films exhibit a Gaussian trend, showing extreme sensitivity to temperature. CZTS films follow a double exponential function, with optimal grain size at 300°C. Sb 2 Se 3 films adhere to a power law (~T 6 ), with grain size rapidly increasing at higher temperatures. These temperature-dependent behaviours offer insights into optimizing fabrication processes and enhancing the efficiency of these materials in photovoltaic applications.
ISSN:0361-5235
1543-186X
DOI:10.1007/s11664-024-11585-w