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Electronic band structure of graphene from resonant soft x-ray spectroscopy: The role of core-hole effects
The electronic structure and band dispersion of graphene on SiO sub(2) have been studied by x-ray-absorption spectroscopy (XAS), x-ray-emission spectroscopy (XES), and resonant inelastic x-ray scattering (RIXS). Using first-principles calculations, it is found that the core-hole effect is dramatic i...
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Published in: | Physical review. B, Condensed matter and materials physics Condensed matter and materials physics, 2012-12, Vol.86 (24), p.245430, Article 245430 |
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Main Authors: | , , , , , , , , , , |
Format: | Article |
Language: | English |
Subjects: | |
Citations: | Items that this one cites Items that cite this one |
Online Access: | Get full text |
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Summary: | The electronic structure and band dispersion of graphene on SiO sub(2) have been studied by x-ray-absorption spectroscopy (XAS), x-ray-emission spectroscopy (XES), and resonant inelastic x-ray scattering (RIXS). Using first-principles calculations, it is found that the core-hole effect is dramatic in XAS while it has negligible consequences in XES. Strong dispersive features, due to the conservation of crystal momentum, are observed in RIXS spectra. Simulated RIXS spectra based on the Kramers-Heisenberg theory agree well with the experimental results, provided a shift between RIXS and XAS due to the absence or presence of the core hole is taken into account. |
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ISSN: | 1098-0121 1550-235X 1550-235X |
DOI: | 10.1103/PhysRevB.86.245430 |