Observed Critical Thickness in Selectively and Non-Selectively Grown Si1-xGex Layers on Patterned Substrates

Relaxation of SiGe layers grown selectively or non-selectively on oxide-patterned substrates using reduced pressure chemical vapor deposition was investigated. The influences of the buffer layer, the polycrystalline layer on the oxide and the opening size on the critical thickness for relaxation of...

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Published in:Physica scripta 2002-01, Vol.2002 (1), p.42
Main Authors: Radamson, H H, Bentzen, A, Menon, C, Landgren, G
Format: Article
Language:English
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heterostructures
misfit dislocations
molecular-beam-epitaxy
nonplanar surfaces
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Bentzen, A
Menon, C
Landgren, G
description Relaxation of SiGe layers grown selectively or non-selectively on oxide-patterned substrates using reduced pressure chemical vapor deposition was investigated. The influences of the buffer layer, the polycrystalline layer on the oxide and the opening size on the critical thickness for relaxation of SiGe layers have been studied in detail. High resolution reciprocal lattice mapping, atomic force microscopy and Normanski optical microscope have been used as the main characterization tools.
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source Institute of Physics:Jisc Collections:IOP Publishing Read and Publish 2024-2025 (Reading List)
subjects heterostructures
misfit dislocations
molecular-beam-epitaxy
nonplanar surfaces
title Observed Critical Thickness in Selectively and Non-Selectively Grown Si1-xGex Layers on Patterned Substrates
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