Junction barrier Schottky diodes in 6H SiC

Junction barrier Schottky (JBS) diodes in 6H SiC have been fabricated and characterised electrically. This device, demonstrated in silicon technology, has the advantage of a low forward voltage drop comparable to that of Schottky diodes, as well as a high blocking voltage and low reverse leakage cur...

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Bibliographic Details
Published in:Solid-state electronics 1998-09, Vol.42 (9), p.1757-1759
Main Authors: Zetterling, Carl-Mikael, Dahlquist, Fanny, Lundberg, Nils, Östling, Mikael, Rottner, Kurt, Ramberg, Lennart
Format: Article
Language:English
Subjects:
Current density
Electric potential
Electric resistance
Junction barrier Schottky (JBS) diodes
Leakage currents
Schottky barrier diodes
Semiconductor junctions
Silicon carbide
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Summary:Junction barrier Schottky (JBS) diodes in 6H SiC have been fabricated and characterised electrically. This device, demonstrated in silicon technology, has the advantage of a low forward voltage drop comparable to that of Schottky diodes, as well as a high blocking voltage and low reverse leakage current of a pn junction. This is especially attractive for wide bandgap materials such as SiC in which pn junctions have a large forward voltage drop. The devices were capable of blocking up to 1100 V with a leakage current density of 0.15 A cm −2, limited by the leakage when the drift region was fully depleted, or breakdown of the SiC material itself. The forward conduction was limited by an on-resistance of 20 mΩ cm 2, resulting in forward voltage drops of 2.6 V at 100 A cm −2.
ISSN:0038-1101
1879-2405
1879-2405
DOI:10.1016/S0038-1101(98)00142-7