The electronic structure of polymer–metal interfaces studied by ultraviolet photoelectron spectroscopy

• Published in: Materials science & engineering. R, Reports : a review journal Reports : a review journal, 2001-09, Vol.34 (3), p.121-146
• Main Authors: Salaneck, W.R, Lögdlund, M, Fahlman, M, Greczynski, G, Kugler, Th
• Format: Article
• Language: English
• Subjects: Condensed matter: electronic structure, electrical, magnetic, and optical properties; Electron states and collective excitations in thin films, multilayers, quantum wells, mesoscopic and nanoscale systems; Electronic structure and electrical properties of surfaces, interfaces, thin films and low-dimensional structures; Exact sciences and technology; Light emitting devices; Multilayers; Physics; Polymer electronics; Polymer interfaces; Polymer surfaces; Surface sensitive method; TECHNOLOGY; TEKNIKVETENSKAP; Ultraviolet photoelectron spectroscopy; UPS; X-ray photoelectron spectroscopy
• ISSN: 0927-796X; 1879-212X; 1879-212X
• DOI: 10.1016/S0927-796X(01)00036-5

Ultraviolet photoelectron spectroscopy has come of age. UPS can take its place beside its older, better-known sister, ESCA (or XPS) as a surface sensitive method which has become more useful in learning certain specific things about interfaces at distances significantly larger than the typical electron elastic mean-free-paths dictated by the photon energies employed. In particular, the emergence of UPS as a real tool for interfacial studies has been applications driven, evolving after needs within polymer-based electronics applications. The situation is clarified through the use of several examples, drawn from the applications-spectroscopy literature.