Simulation of the X-ray response of scintillator coated silicon CCDs

Silicon CCDs are used for X-ray imaging in fields as dentistry and materials testing. Due to the low X-ray absorption in silicon the CCD is generally coated with a scintillating layer. In order to evaluate the response for different combinations of scintillator material, scintillator geometry and de...

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Bibliographic Details
Published in:IEEE transactions on nuclear science 1998-06, Vol.45 (3), p.374-378
Main Authors: Frojdh, C., Nilsson, H.E., Nelvig, P., Petersson, C.S.
Format: Article
Language:English
Subjects:
Charge coupled devices
Dentistry
Electrical engineering, electronics and photonics
Electromagnetic wave absorption
Elektroteknik, elektronik och fotonik
Signal detection
Signal to noise ratio
Silicon
Spatial resolution
TECHNOLOGY
TEKNIKVETENSKAP
X-ray detection
X-ray detectors
X-ray imaging
X-ray imaging detectors
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Summary:Silicon CCDs are used for X-ray imaging in fields as dentistry and materials testing. Due to the low X-ray absorption in silicon the CCD is generally coated with a scintillating layer. In order to evaluate the response for different combinations of scintillator material, scintillator geometry and detector we have developed a simulation program. The program calculates the signal to noise ratio and spatial resolution based on both the signal from the scintillating layer and the signal from direct detection of X-rays in the detector. Results obtained with this program indicate that the signal to noise ratio in the system is optimized by using a scintillator with high X-ray absorption and high light output while minimizing the signal from direct detection in the CCD. The spatial resolution can be increased by defining pixels in the scintillator.
ISSN:0018-9499
1558-1578
1558-1578
DOI:10.1109/23.682411