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Comparison of the Josephson voltage standards of the SP and the BIPM
Comparisons of the 1 V Josephson-array voltage standard (JAVS) of the Bureau International des Poids et Mesures (BIPM) were made with that of the Swedish National Testing and Research Institute (SP), Boras, Sweden, in April 1996. The results agree within an overall uncertainty of less than 1 nV.
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Published in: | IEEE transactions on instrumentation and measurement 1997-04, Vol.46 (2), p.220-223 |
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container_end_page | 223 |
container_issue | 2 |
container_start_page | 220 |
container_title | IEEE transactions on instrumentation and measurement |
container_volume | 46 |
creator | Reymann, D. Witt, T.J. Eklund, G. Pajander, H. Nilsson, H. |
description | Comparisons of the 1 V Josephson-array voltage standard (JAVS) of the Bureau International des Poids et Mesures (BIPM) were made with that of the Swedish National Testing and Research Institute (SP), Boras, Sweden, in April 1996. The results agree within an overall uncertainty of less than 1 nV. |
doi_str_mv | 10.1109/19.571817 |
format | article |
fullrecord | <record><control><sourceid>proquest_swepu</sourceid><recordid>TN_cdi_swepub_primary_oai_DiVA_org_ri_5702</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><ieee_id>571817</ieee_id><sourcerecordid>28203854</sourcerecordid><originalsourceid>FETCH-LOGICAL-c341t-86fd90b38e526691a0c3e0fba1224b4764014df936fed55fcf117d4229de52fc3</originalsourceid><addsrcrecordid>eNo9kEtPwzAQhC0EEqVw4MopB4QEUorXsZ34WFoeRUVU4nG1HMdug9I62CmIf09KSk-7mv1mtBqETgEPALC4BjFgKWSQ7qEeMJbGgnOyj3oYQxYLyvghOgrhA2Occpr20HjklrXyZXCryNmoWZjo0QVTLzbCl6saNTdRaNSqUL4I_8jLLGqVv_VmMns6RgdWVcGcbGcfvd3dvo4e4unz_WQ0nMY6odDEGbeFwHmSGUY4F6CwTgy2uQJCaE7bhzDQwoqEW1MwZrUFSAtKiChah9VJH111ueHb1Otc1r5cKv8jnSrluHwfSufn0peSpZi08EUH1959rk1o5LIM2lSVWhm3DpJkBCcZoy142YHauxC8sbtcwHJTqgQhu1Jb9nwbqoJWlfVqpcuwM5AMWIZxi511WGmM2V23Gb_vA3zv</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>28203854</pqid></control><display><type>article</type><title>Comparison of the Josephson voltage standards of the SP and the BIPM</title><source>IEEE Electronic Library (IEL) Journals</source><creator>Reymann, D. ; Witt, T.J. ; Eklund, G. ; Pajander, H. ; Nilsson, H.</creator><creatorcontrib>Reymann, D. ; Witt, T.J. ; Eklund, G. ; Pajander, H. ; Nilsson, H.</creatorcontrib><description>Comparisons of the 1 V Josephson-array voltage standard (JAVS) of the Bureau International des Poids et Mesures (BIPM) were made with that of the Swedish National Testing and Research Institute (SP), Boras, Sweden, in April 1996. The results agree within an overall uncertainty of less than 1 nV.</description><identifier>ISSN: 0018-9456</identifier><identifier>ISSN: 1557-9662</identifier><identifier>EISSN: 1557-9662</identifier><identifier>DOI: 10.1109/19.571817</identifier><identifier>CODEN: IEIMAO</identifier><language>eng</language><publisher>New York, NY: IEEE</publisher><subject>Electrical and electronic components, instruments and techniques ; Electrical resistance measurement ; Exact sciences and technology ; Filters ; Frequency ; Instruments, apparatus, components and techniques common to several branches of physics and astronomy ; Laboratories ; Measurement standards ; Metrology ; Metrology, measurements and laboratory procedures ; NIST ; Physics ; Switches ; Testing ; Units and standards ; Voltage</subject><ispartof>IEEE transactions on instrumentation and measurement, 1997-04, Vol.46 (2), p.220-223</ispartof><rights>1997 INIST-CNRS</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c341t-86fd90b38e526691a0c3e0fba1224b4764014df936fed55fcf117d4229de52fc3</citedby><cites>FETCH-LOGICAL-c341t-86fd90b38e526691a0c3e0fba1224b4764014df936fed55fcf117d4229de52fc3</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/571817$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>230,309,310,314,780,784,789,790,885,23930,23931,25140,27924,27925,54796</link.rule.ids><backlink>$$Uhttp://pascal-francis.inist.fr/vibad/index.php?action=getRecordDetail&idt=2815800$$DView record in Pascal Francis$$Hfree_for_read</backlink><backlink>$$Uhttps://urn.kb.se/resolve?urn=urn:nbn:se:ri:diva-5702$$DView record from Swedish Publication Index$$Hfree_for_read</backlink></links><search><creatorcontrib>Reymann, D.</creatorcontrib><creatorcontrib>Witt, T.J.</creatorcontrib><creatorcontrib>Eklund, G.</creatorcontrib><creatorcontrib>Pajander, H.</creatorcontrib><creatorcontrib>Nilsson, H.</creatorcontrib><title>Comparison of the Josephson voltage standards of the SP and the BIPM</title><title>IEEE transactions on instrumentation and measurement</title><addtitle>TIM</addtitle><description>Comparisons of the 1 V Josephson-array voltage standard (JAVS) of the Bureau International des Poids et Mesures (BIPM) were made with that of the Swedish National Testing and Research Institute (SP), Boras, Sweden, in April 1996. The results agree within an overall uncertainty of less than 1 nV.</description><subject>Electrical and electronic components, instruments and techniques</subject><subject>Electrical resistance measurement</subject><subject>Exact sciences and technology</subject><subject>Filters</subject><subject>Frequency</subject><subject>Instruments, apparatus, components and techniques common to several branches of physics and astronomy</subject><subject>Laboratories</subject><subject>Measurement standards</subject><subject>Metrology</subject><subject>Metrology, measurements and laboratory procedures</subject><subject>NIST</subject><subject>Physics</subject><subject>Switches</subject><subject>Testing</subject><subject>Units and standards</subject><subject>Voltage</subject><issn>0018-9456</issn><issn>1557-9662</issn><issn>1557-9662</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>1997</creationdate><recordtype>article</recordtype><recordid>eNo9kEtPwzAQhC0EEqVw4MopB4QEUorXsZ34WFoeRUVU4nG1HMdug9I62CmIf09KSk-7mv1mtBqETgEPALC4BjFgKWSQ7qEeMJbGgnOyj3oYQxYLyvghOgrhA2Occpr20HjklrXyZXCryNmoWZjo0QVTLzbCl6saNTdRaNSqUL4I_8jLLGqVv_VmMns6RgdWVcGcbGcfvd3dvo4e4unz_WQ0nMY6odDEGbeFwHmSGUY4F6CwTgy2uQJCaE7bhzDQwoqEW1MwZrUFSAtKiChah9VJH111ueHb1Otc1r5cKv8jnSrluHwfSufn0peSpZi08EUH1959rk1o5LIM2lSVWhm3DpJkBCcZoy142YHauxC8sbtcwHJTqgQhu1Jb9nwbqoJWlfVqpcuwM5AMWIZxi511WGmM2V23Gb_vA3zv</recordid><startdate>19970401</startdate><enddate>19970401</enddate><creator>Reymann, D.</creator><creator>Witt, T.J.</creator><creator>Eklund, G.</creator><creator>Pajander, H.</creator><creator>Nilsson, H.</creator><general>IEEE</general><general>Institute of Electrical and Electronics Engineers</general><scope>IQODW</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>7SP</scope><scope>7U5</scope><scope>8FD</scope><scope>L7M</scope><scope>ADTPV</scope><scope>AOWAS</scope></search><sort><creationdate>19970401</creationdate><title>Comparison of the Josephson voltage standards of the SP and the BIPM</title><author>Reymann, D. ; Witt, T.J. ; Eklund, G. ; Pajander, H. ; Nilsson, H.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c341t-86fd90b38e526691a0c3e0fba1224b4764014df936fed55fcf117d4229de52fc3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>1997</creationdate><topic>Electrical and electronic components, instruments and techniques</topic><topic>Electrical resistance measurement</topic><topic>Exact sciences and technology</topic><topic>Filters</topic><topic>Frequency</topic><topic>Instruments, apparatus, components and techniques common to several branches of physics and astronomy</topic><topic>Laboratories</topic><topic>Measurement standards</topic><topic>Metrology</topic><topic>Metrology, measurements and laboratory procedures</topic><topic>NIST</topic><topic>Physics</topic><topic>Switches</topic><topic>Testing</topic><topic>Units and standards</topic><topic>Voltage</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Reymann, D.</creatorcontrib><creatorcontrib>Witt, T.J.</creatorcontrib><creatorcontrib>Eklund, G.</creatorcontrib><creatorcontrib>Pajander, H.</creatorcontrib><creatorcontrib>Nilsson, H.</creatorcontrib><collection>Pascal-Francis</collection><collection>CrossRef</collection><collection>Electronics & Communications Abstracts</collection><collection>Solid State and Superconductivity Abstracts</collection><collection>Technology Research Database</collection><collection>Advanced Technologies Database with Aerospace</collection><collection>SwePub</collection><collection>SwePub Articles</collection><jtitle>IEEE transactions on instrumentation and measurement</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Reymann, D.</au><au>Witt, T.J.</au><au>Eklund, G.</au><au>Pajander, H.</au><au>Nilsson, H.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Comparison of the Josephson voltage standards of the SP and the BIPM</atitle><jtitle>IEEE transactions on instrumentation and measurement</jtitle><stitle>TIM</stitle><date>1997-04-01</date><risdate>1997</risdate><volume>46</volume><issue>2</issue><spage>220</spage><epage>223</epage><pages>220-223</pages><issn>0018-9456</issn><issn>1557-9662</issn><eissn>1557-9662</eissn><coden>IEIMAO</coden><abstract>Comparisons of the 1 V Josephson-array voltage standard (JAVS) of the Bureau International des Poids et Mesures (BIPM) were made with that of the Swedish National Testing and Research Institute (SP), Boras, Sweden, in April 1996. The results agree within an overall uncertainty of less than 1 nV.</abstract><cop>New York, NY</cop><pub>IEEE</pub><doi>10.1109/19.571817</doi><tpages>4</tpages></addata></record> |
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source | IEEE Electronic Library (IEL) Journals |
subjects | Electrical and electronic components, instruments and techniques Electrical resistance measurement Exact sciences and technology Filters Frequency Instruments, apparatus, components and techniques common to several branches of physics and astronomy Laboratories Measurement standards Metrology Metrology, measurements and laboratory procedures NIST Physics Switches Testing Units and standards Voltage |
title | Comparison of the Josephson voltage standards of the SP and the BIPM |
url | http://sfxeu10.hosted.exlibrisgroup.com/loughborough?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-07T10%3A40%3A25IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest_swepu&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Comparison%20of%20the%20Josephson%20voltage%20standards%20of%20the%20SP%20and%20the%20BIPM&rft.jtitle=IEEE%20transactions%20on%20instrumentation%20and%20measurement&rft.au=Reymann,%20D.&rft.date=1997-04-01&rft.volume=46&rft.issue=2&rft.spage=220&rft.epage=223&rft.pages=220-223&rft.issn=0018-9456&rft.eissn=1557-9662&rft.coden=IEIMAO&rft_id=info:doi/10.1109/19.571817&rft_dat=%3Cproquest_swepu%3E28203854%3C/proquest_swepu%3E%3Cgrp_id%3Ecdi_FETCH-LOGICAL-c341t-86fd90b38e526691a0c3e0fba1224b4764014df936fed55fcf117d4229de52fc3%3C/grp_id%3E%3Coa%3E%3C/oa%3E%3Curl%3E%3C/url%3E&rft_id=info:oai/&rft_pqid=28203854&rft_id=info:pmid/&rft_ieee_id=571817&rfr_iscdi=true |