Operation and performance of the ATLAS semiconductor tracker

The semiconductor tracker is a silicon microstrip detector forming part of the inner tracking system of the ATLAS experiment at the LHC. The operation and performance of the semiconductor tracker during the first years of LHC running are described. More than 99% of the detector modules were operatio...

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Bibliographic Details
Published in:Journal of instrumentation 2014, Vol.9 (8), p.P08009-P08009
Main Author: collaboration, The ATLAS
Format: Article
Language:English
Subjects:
Background radiation
Charge transport and multiplication in solid media
Detector modelling and simulations I (interaction of radiation with matter
Detector modelling and simulations I (interaction of radiation with matter, interaction of photons with matter, interaction of hadrons with matter, etc)
Detectors
etc
Evolution
High Energy Physics - Experiment
Instrumentation
interaction of hadrons with matter
interaction of photons with matter
Leakage current
Particle tracking detectors (Solid-state detectors)
Physics
PHYSICS OF ELEMENTARY PARTICLES AND FIELDS
Running
Semiconductors
Silicon
Simulation
Solid state detectors
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Description
Summary:The semiconductor tracker is a silicon microstrip detector forming part of the inner tracking system of the ATLAS experiment at the LHC. The operation and performance of the semiconductor tracker during the first years of LHC running are described. More than 99% of the detector modules were operational during this period, with an average intrinsic hit efficiency of (99.74+ or -0.04)%. The evolution of the noise occupancy is discussed, and measurements of the Lorentz angle, delta -ray production and energy loss presented. The alignment of the detector is found to be stable at the few-micron level over long periods of time. Radiation damage measurements, which include the evolution of detector leakage currents, are found to be consistent with predictions and are used in the verification of radiation background simulations.
ISSN:1748-0221
1748-0221
DOI:10.1088/1748-0221/9/08/P08009