Nanocrystal size distribution analysis from transmission electron microscopy images

We propose a method, with minimal bias caused by user input, to quickly detect and measure the nanocrystal size distribution from transmission electron microscopy (TEM) images using a combination of Laplacian of Gaussian filters and non-maximum suppression. We demonstrate the proposed method on brig...

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Bibliographic Details
Published in:Nanoscale 2015-12, Vol.7 (48), p.20593-20606
Main Authors: van Sebille, Martijn, van der Maaten, Laurens J P, Xie, Ling, Jarolimek, Karol, Santbergen, Rudi, van Swaaij, René A C M M, Leifer, Klaus, Zeman, Miro
Format: Article
Language:English
Subjects:
Gaussian
Image detection
Image transmission
Manuals
Mathematical analysis
Nanocrystals
Size distribution
Transmission electron microscopy
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Summary:We propose a method, with minimal bias caused by user input, to quickly detect and measure the nanocrystal size distribution from transmission electron microscopy (TEM) images using a combination of Laplacian of Gaussian filters and non-maximum suppression. We demonstrate the proposed method on bright-field TEM images of an a-SiC:H sample containing embedded silicon nanocrystals with varying magnifications and we compare the accuracy and speed with size distributions obtained by manual measurements, a thresholding method and PEBBLES. Finally, we analytically consider the error induced by slicing nanocrystals during TEM sample preparation on the measured nanocrystal size distribution and formulate an equation to correct this effect.
ISSN:2040-3364
2040-3372
2040-3372
DOI:10.1039/c5nr06292f