Low Frequency Noise in Contacted Single-Wall Carbon Nanotube

Since their discovery, carbon nanotubes present many interesting electrical properties and can be candidates for future shrinking devices. Electrode realization on nanotubes remains a challenge. The deposited contacts must present interesting electrical parameters: low contact resistance, low series...

Full description

Saved in:
Bibliographic Details
Main Authors: Soliverès, S., Hoffmann, A., Pascal, F., Delseny, C., Kabir, M.S., Nur, O., Salesse, A., Willander, M., Deen, M.J.
Format: Conference Proceeding
Language:English
Subjects:
Electronics
Engineering Sciences
Fysik
Physical Sciences
Online Access:Get full text
Tags: Add Tag
No Tags, Be the first to tag this record!
Description
Summary:Since their discovery, carbon nanotubes present many interesting electrical properties and can be candidates for future shrinking devices. Electrode realization on nanotubes remains a challenge. The deposited contacts must present interesting electrical parameters: low contact resistance, low series resistance, low parasitic capacity and low excess noise. The understanding of conduction phenomena induced into or near the metal/nanotube contact is necessary to improve the device. In this paper we present characterization of a Au-Ti deposited contact on a single-wall carbon nanotube. Steady-state current-voltage measurements, impedance and noise measurements lead to the frequency device characteristic. From this study a low frequency noise electrical model is presented. Using this model and the low frequency noise measurements, we show that the measured thermal noise has its origin in the electrode/nanotube contacts
ISSN:0094-243X
1551-7616
DOI:10.1063/1.2036793