MATERIAL ELECTROMAGNETIC PARAMETERS EXTRACTION USING SVM METHOD

The method extracting the electromagnetic parameters from scattering coefficients was studied in this paper. The Support Vector Machine （SVM） method is used to solve the inverse problem of parameters extraction. The mapping relationship is set up by calculating a large number of S pa-rameters from t...

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Bibliographic Details
Published in:Journal of electronics (China) 2010, Vol.27 (4), p.544-547
Main Authors: Xiao, Huaibao, Lu, guizhen, Li, Yanfei
Format: Article
Language:English
Subjects:
Electrical Engineering
Engineering
SVM
介电常数
传输线理论
提取方法
支持向量机
散射系数
电磁参数
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Summary:The method extracting the electromagnetic parameters from scattering coefficients was studied in this paper. The Support Vector Machine （SVM） method is used to solve the inverse problem of parameters extraction. The mapping relationship is set up by calculating a large number of S pa-rameters from the samples with different permittivity by using transmission line theory. The simulated data set is used as training data set for SVM. After the training, the SVM is used to predict the permittivity of material from the scattering coefficients.
ISSN:0217-9822
1993-0615
DOI:10.1007/s11767-011-0322-5