X-band deflecting cavity design for ultra-short bunch length measurement of SXFEL at SINAP

For developing the X-ray Free Electron Lasers test facility （SXFEL） at Shanghai Institute of Applied Physics, Chinese Academy of Sciences （SINAP）, ultra-short bunch is the crucial requirement for excellent lasing perfor- mance. It is a big challenge for deflecting cavity to measure the length of ult...

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Bibliographic Details
Published in:核技术（英文版） 2014-12, Vol.25 (6), p.1-6
Main Author: 谭建豪 顾强 方文程 童德春 赵振堂
Format: Article
Language:English
Subjects:
X波段
偏转
束团长度
结构紧凑
腔设计
自由电子激光
超短
长度测量
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Summary:For developing the X-ray Free Electron Lasers test facility （SXFEL） at Shanghai Institute of Applied Physics, Chinese Academy of Sciences （SINAP）, ultra-short bunch is the crucial requirement for excellent lasing perfor- mance. It is a big challenge for deflecting cavity to measure the length of ultra-short bunch, and higher deflecting gradient is required for higher measurement resolution. X-band travelling wave deflecting structure has features of higher deflecting voltage and compact structure, which has good performance at ultra-short bunch length measurement. In this paper, a new X-band deflecting structure is designed to operate in HEM11-2π/3 mode. For suppressing the polarization of deflecting plane of the HEM11 mode, two symmetrical caves are added on the cavity wall to separate two polarized modes.
ISSN:1001-8042
2210-3147
DOI:10.13538/j.1001-8042/nst.25.060101