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Iterative and accurate determination of small angle X-ray scattering background

X-ray scattering is widely used in materialstructural characterizations. The weak scattering nature,however, makes it susceptible to background noise and canconsequently render the final results unreliable. In thispaper, we report an iterative method to determine X-rayscattering background and demon...

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Bibliographic Details
Published in:Nuclear science and techniques 2016-10, Vol.27 (5), p.109-113, Article 105
Main Authors: Wang, Geng, Xu, Li-Feng, Shen, Jian-Lei, Yao, Guang-Bao, Ge, Zhi-Lei, Li, Wen-Qin, Fan, Chun-Hai, Chen, Gang
Format: Article
Language:English
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Summary:X-ray scattering is widely used in materialstructural characterizations. The weak scattering nature,however, makes it susceptible to background noise and canconsequently render the final results unreliable. In thispaper, we report an iterative method to determine X-rayscattering background and demonstrate its feasibility bysmall angle X-ray scattering on gold nanoparticles. Thismethod solely relies on the correct structural modeling ofthe sample to separate scattering signal from background indata fitting processes, which allows them to be immunefrom experimental uncertainties. The importance of accu-rate determination of the scaling factor for backgroundsubtraction is also illustrated.Keywords
ISSN:1001-8042
2210-3147
DOI:10.1007/s41365-016-0108-4