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Iterative and accurate determination of small angle X-ray scattering background
X-ray scattering is widely used in materialstructural characterizations. The weak scattering nature,however, makes it susceptible to background noise and canconsequently render the final results unreliable. In thispaper, we report an iterative method to determine X-rayscattering background and demon...
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Published in: | Nuclear science and techniques 2016-10, Vol.27 (5), p.109-113, Article 105 |
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Main Authors: | , , , , , , , |
Format: | Article |
Language: | English |
Subjects: | |
Citations: | Items that this one cites Items that cite this one |
Online Access: | Get full text |
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Summary: | X-ray scattering is widely used in materialstructural characterizations. The weak scattering nature,however, makes it susceptible to background noise and canconsequently render the final results unreliable. In thispaper, we report an iterative method to determine X-rayscattering background and demonstrate its feasibility bysmall angle X-ray scattering on gold nanoparticles. Thismethod solely relies on the correct structural modeling ofthe sample to separate scattering signal from background indata fitting processes, which allows them to be immunefrom experimental uncertainties. The importance of accu-rate determination of the scaling factor for backgroundsubtraction is also illustrated.Keywords |
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ISSN: | 1001-8042 2210-3147 |
DOI: | 10.1007/s41365-016-0108-4 |