Low-temperature sintering and microwave dielectric properties of CaMg1−xLi2xSi2O6 (x = 0−0.3) ceramics

In this study, low-temperature fired CaMg 1− x Li 2 x Si 2 O 6 microwave dielectric ceramics were prepared via the traditional solid-state reaction method. In this process, 0.4 wt% Li 2 CO 3 -B 2 O 3 -SiO 2 -CaCO 3 -Al 2 O 3 (LBSCA) glass was added as a sintering aid. The results showed that ceramic...

Full description

Saved in:
Bibliographic Details
Published in:Journal of advanced ceramics 2020-08, Vol.9 (4), p.471-480
Main Authors: Huang, Fangyi, Su, Hua, Li, Yuanxun, Zhang, Huaiwu, Tang, Xiaoli
Format: Article
Language:English
Subjects:
Aluminum oxide
Boron oxides
Calcium carbonate
Ceramic bonding
Ceramics
Characterization and Evaluation of Materials
Chemistry and Materials Science
Composites
Densification
Dielectric properties
Glass
Low temperature
Materials Science
Morphology
Nanotechnology
Natural Materials
Q factors
Research Article
Resonant frequencies
Silicon dioxide
Sintering
Structural Materials
Substitution reactions
Substrates
Citations: Items that this one cites
Items that cite this one
Online Access:Get full text
Tags: Add Tag
No Tags, Be the first to tag this record!
Description
Summary:In this study, low-temperature fired CaMg 1− x Li 2 x Si 2 O 6 microwave dielectric ceramics were prepared via the traditional solid-state reaction method. In this process, 0.4 wt% Li 2 CO 3 -B 2 O 3 -SiO 2 -CaCO 3 -Al 2 O 3 (LBSCA) glass was added as a sintering aid. The results showed that ceramics consisted of CaMgSi 2 O 6 as the main phase. The second phases were CaSiO 3 always existing and Li 2 SiO 3 occurring at substitution content x > 0.05. Li + substitution effectively lowered sintering temperature due to 0.4 wt% LBSCA and contributed to grain densification, and the most homogeneous morphology could be observed at x = 0.05. The effects of relative density, the second phase, and ionic polarizability on dielectric constant (ε r ) were investigated. The quality factor ( Q × f ) varied with packing fraction that concerned the second phase. Moreover, the temperature coefficient of the resonant frequency (τ f ) was influenced by MgO 6 octahedral distortion and bond valence. Excellent dielectric properties of the CaMg 1− x Li 2 x Si 2 O 6 ceramic was exhibited at x = 0.05 with ε r = 7.44, Q × f = 41,017 GHz ( f = 15.1638 GHz), and τ f = −59.3 ppm/°C when sintered at 900 °C. It had a good application prospect in the field of low-temperature co-fired ceramic (LTCC) substrate and devices.
ISSN:2226-4108
2227-8508
DOI:10.1007/s40145-020-0390-9