Structure and magnetic properties of Ni50Mn35In15 thin film

Thin film of Ni50Mn35In15 Heusler alloy was prepared on Mg O(001) substrate by epitaxial growth in an ultra-high vacuum(UHV) chamber by a Pulsed Laser Deposition(PLD) method. The epitaxial growth process was monitored by in situ reflection high energy electron diffraction(RHEED) and the structure of...

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Bibliographic Details
Published in:Progress in natural science 2015-04, Vol.25 (2), p.117-121
Main Authors: Jing, Chao, Yu, Liju, Zheng, Dong, Liao, Pan, Cao, Yiming, Liang, Jianhui, Li, Zhe, Kang, Baojuan, Zhang, Jincang
Format: Article
Language:English
Subjects:
alloy
deposition
laser
Magnetic
Magnetic properties
Ni50Mn35In15 Heusler alloy
Ni50Mn35In15Heusler
properties
Pulsed
Pulsed laser deposition
Thin
Thin film
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Summary:Thin film of Ni50Mn35In15 Heusler alloy was prepared on Mg O(001) substrate by epitaxial growth in an ultra-high vacuum(UHV) chamber by a Pulsed Laser Deposition(PLD) method. The epitaxial growth process was monitored by in situ reflection high energy electron diffraction(RHEED) and the structure of the film was checked by ex situ X-ray diffraction(XRD), which indicates that high quality Ni50Mn35In15 single crystal film with a face-centered-cubic(fcc) structure could be stabilized on Mg O(001). Magnetic property measurement was also conducted at various temperatures by using physical property measurement system(PPMS). A significant exchange bias was observed for Ni50Mn35In15 film,and the strength of the exchange bias field(HEB) increases with the decrease of temperature. Such a behavior can be ascribed to the fact that the interfacial spin interaction between ferromagnetic(FM) and antiferromagnetic(AFM) cluster is enhanced with the decrease of temperature.
ISSN:1002-0071
DOI:10.1016/j.pnsc.2015.03.004