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STRUCTURAL CHARACTERISTICS OF La2O3 THIN FILM GROWN ON LaB6
Within the framework of hexagonal lanthanum oxide (h-La2O3) formation, lanthanum hexaboride film on sapphire substrate (LaB6/Al2O3) was oxidized at different temperatures (700-1000 °C) under reduced atmospheric pressure (1·10-2,1.5·10-1Torr) during 30 min. The composition evolution of La2O3/LaB6 str...
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Published in: | International journal of modern physics. Conference series 2012, Vol.15, p.61-66 |
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Main Authors: | , , , , , , , , , |
Format: | Article |
Language: | English |
Online Access: | Get full text |
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Summary: | Within the framework of hexagonal lanthanum oxide (h-La2O3) formation, lanthanum hexaboride film on sapphire substrate (LaB6/Al2O3) was oxidized at different temperatures (700-1000 °C) under reduced atmospheric pressure (1·10-2,1.5·10-1Torr) during 30 min. The composition evolution of La2O3/LaB6 structure versus annealing temperature has been studied using XRD, FIR reflectivity spectroscopy, SEM and electron probe X-ray microanalysis (EDS). The annealing of the LaB6 film at T=700 °C under air pressure of 1·10-2 Torr generates thin La2O3 layer which exhibits as inferred from XRD the hexagonal phase. The hydratation of La2O3/LaB6/Al2O3 in distilled water for 30 min and postannealing at 900 °C under air pressure of 1.5·10-1 Torr transform h-La2O3 into hexagonal La(OH)3 phase accompanied monoclinic LaO(OH) and lanthanum oxide carbonate hydrate species. |
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ISSN: | 2010-1945 2010-1945 |
DOI: | 10.1142/S2010194512006964 |