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Digital hardware testing : transistor-level fault modeling and testing / Rochit Rajsuman. transistor-level fault modeling and testing /

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Bibliographic Details
Main Author: Rajsuman, Rochit
Format: Book
Language:English
Published: Boston : Artech House, 1992
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Pilkington Library

Availability details from Pilkington Library
Shelfmark: 621.3819583/RAJ
Copy number Shelving location Availability
Copy [0400644517] Unknown On Shelf