APA (7th ed.) Citation

IFIP TC5 WG5.3/5.7 International Working Conference on the Design of Information Infrastructure Systems for Manufacturing Fort Worth, Tex., Mills, J. J., & Kimura, F. (1999). Information infrastructure systems for manufacturing II : IFIP TC5 WG5.3/5.7 third International Working Conference on the Design of Information Infrastructure Systems for Manufacturing (DIISM'98) : May 18-20, 1998, Fort Worth, Texas / edited by John J. Mills, Fumihiko Kimura: IFIP TC5 WG5.3/5.7 third International Working Conference on the Design of Information Infrastructure Systems for Manufacturing (DIISM'98) : May 18-20, 1998, Fort Worth, Texas. Kluwer Academic.

Chicago Style (17th ed.) Citation

IFIP TC5 WG5.3/5.7 International Working Conference on the Design of Information Infrastructure Systems for Manufacturing Fort Worth, Tex., J. J. Mills, and F. Kimura. Information Infrastructure Systems for Manufacturing II : IFIP TC5 WG5.3/5.7 Third International Working Conference on the Design of Information Infrastructure Systems for Manufacturing (DIISM'98) : May 18-20, 1998, Fort Worth, Texas / Edited by John J. Mills, Fumihiko Kimura: IFIP TC5 WG5.3/5.7 Third International Working Conference on the Design of Information Infrastructure Systems for Manufacturing (DIISM'98) : May 18-20, 1998, Fort Worth, Texas. Boston, Mass. ; London: Kluwer Academic, 1999.

MLA (9th ed.) Citation

IFIP TC5 WG5.3/5.7 International Working Conference on the Design of Information Infrastructure Systems for Manufacturing Fort Worth, Tex., et al. Information Infrastructure Systems for Manufacturing II : IFIP TC5 WG5.3/5.7 Third International Working Conference on the Design of Information Infrastructure Systems for Manufacturing (DIISM'98) : May 18-20, 1998, Fort Worth, Texas / Edited by John J. Mills, Fumihiko Kimura: IFIP TC5 WG5.3/5.7 Third International Working Conference on the Design of Information Infrastructure Systems for Manufacturing (DIISM'98) : May 18-20, 1998, Fort Worth, Texas. Kluwer Academic, 1999.

Warning: These citations may not always be 100% accurate.