IEEE transactions on device and materials reliability.

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Bibliographic Details
Corporate Authors: Institute of Electrical and Electronics Engineers, IEEE Electron Devices Society, IEEE Reliability Society
Format: Serial
Language:English
Published: New York : IEEE.
Subjects:
Electronic apparatus and appliances > Reliability > Periodicals.
Electronic industries > Quality control > Periodicals.
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Holding Statement:Vol. 1-3, 2001-2003.

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