APA (7th ed.) Citation

Bardell, P. H., McAnney, W. H., & Savir, J. (1987). Built-in test for VLSI : pseudorandom techniques / Paul H. Bardell, William H. McAnney, Jacob Savir: Pseudorandom techniques. Wiley.

Chicago Style (17th ed.) Citation

Bardell, Paul H., William H. McAnney, and Jacob Savir. Built-in Test for VLSI : Pseudorandom Techniques / Paul H. Bardell, William H. McAnney, Jacob Savir: Pseudorandom Techniques. New York ; Chichester: Wiley, 1987.

MLA (9th ed.) Citation

Bardell, Paul H., et al. Built-in Test for VLSI : Pseudorandom Techniques / Paul H. Bardell, William H. McAnney, Jacob Savir: Pseudorandom Techniques. Wiley, 1987.

Warning: These citations may not always be 100% accurate.