Society of Photo-optical Instrumentation Engineers, Boeing Company, Gu, Z., & Maradudin, A. A. (2002). Surface scattering and diffraction for advanced metrology II : 9 July, 2002, Seattle, Washington, USA / Zu-Han Gu, Alexei A. Maradudin, chairs/editors ; sponsored and published by SPIE--the International Society for Optical Engineering ; cooperating organizations, the Boeing Company ... [et al.]: 9 July, 2002, Seattle, Washington, USA. SPIE.
Chicago Style (17th ed.) CitationSociety of Photo-optical Instrumentation Engineers, Boeing Company, Zu-Han Gu, and A. A. Maradudin. Surface Scattering and Diffraction for Advanced Metrology II : 9 July, 2002, Seattle, Washington, USA / Zu-Han Gu, Alexei A. Maradudin, Chairs/editors ; Sponsored and Published by SPIE--the International Society for Optical Engineering ; Cooperating Organizations, the Boeing Company ... [et Al.]: 9 July, 2002, Seattle, Washington, USA. Bellingham, Washington: SPIE, 2002.
MLA (9th ed.) CitationSociety of Photo-optical Instrumentation Engineers, et al. Surface Scattering and Diffraction for Advanced Metrology II : 9 July, 2002, Seattle, Washington, USA / Zu-Han Gu, Alexei A. Maradudin, Chairs/editors ; Sponsored and Published by SPIE--the International Society for Optical Engineering ; Cooperating Organizations, the Boeing Company ... [et Al.]: 9 July, 2002, Seattle, Washington, USA. SPIE, 2002.